論文誌
|
K. Takeuchi, K. Sakamoto, Y. Tsuchiya, T. Kato, R. Nakamura, A. Takeyama, T. Makino, T. Ohshima, M. Hashimoto, H. Shindo
|
Cross-Section Prediction Method for Proton Direct Ionization Induced Single Event Upset
|
IEEE Transactions on Nuclear Science
| 72(8)
|
2735 - 2742
|
2025年8月
|
| pdf
|
論文誌
|
S. Manabe, Y. Watanabe, W. Liao, M. Hashimoto, K. Nakano, H. Sato, T. Kin, S. Abe, K. Hamada, M. Tampo, Y. Miyake
|
Negative and Positive Muon-Induced Single Event Upsets in 65-nm UTBB SOI SRAMs
|
IEEE Transactions on Nuclear Science
| 65(8)
|
1742--1749
|
2018年8月
|
| pdf
|
論文誌
|
W. Liao, M. Hashimoto, S. Manabe, Y. Watanabe, K. Nakano, H. Sato, T. Kin, K. Hamada, M. Tampo, Y. Miyake
|
Measurement and Mechanism Investigation of Negative and Positive Muon-Induced Upsets in 65-nm Bulk SRAMs
|
IEEE Transactions on Nuclear Science
| 65(8)
|
1734--1741
|
2018年8月
|
| pdf
|
国際会議
|
K. Takeuchi, K. Sakamoto, Y. Tsuchiya, T. Kato, R. Nakamura, A. Takeyama, T. Makino, T. Ohshima, M. Hashimoto, H. Shindo
|
Cross-Section Prediction Method for Proton Direct Ionization Induced Single Event Upset
|
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
|
|
|
2024年9月
|
|
|
国際会議
|
W. Liao, M. Hashimoto, S. Manabe, Y. Watanabe, K. Nakano, H. Sato, T. Kin, K. Hamada, M. Tampo, Y. Miyake
|
Measurement and Mechanism Investigation of Negative and Positive Muon Induced Upsets in 65nm Bulk SRAMs
|
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
|
|
|
2017年10月
|
|
|
国際会議
|
S. Manabe, Y. Watanabe, W. Liao, M. Hashimoto, K. Nakano, H. Sato, T. Kin, K. Hamada, M. Tampo, Y. Miyake
|
Momentum and Supply Voltage Dependencies of SEUs Induced by Low-Energy Negative and Positive Muons in 65-nm UTBB-SOI SRAMs
|
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
|
|
|
2017年10月
|
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