Academic Journal
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S. Manabe, Y. Watanabe, W. Liao, M. Hashimoto, K. Nakano, H. Sato, T. Kin, S. Abe, K. Hamada, M. Tampo, Y. Miyake
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Negative and Positive Muon-Induced Single Event Upsets in 65-nm UTBB SOI SRAMs
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IEEE Transactions on Nuclear Science
| 65(8)
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1742--1749
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August 2018
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| pdf
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Academic Journal
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W. Liao, M. Hashimoto, S. Manabe, Y. Watanabe, K. Nakano, H. Sato, T. Kin, K. Hamada, M. Tampo, Y. Miyake
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Measurement and Mechanism Investigation of Negative and Positive Muon-Induced Upsets in 65-nm Bulk SRAMs
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IEEE Transactions on Nuclear Science
| 65(8)
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1734--1741
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August 2018
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| pdf
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International Conference
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W. Liao, M. Hashimoto, S. Manabe, Y. Watanabe, K. Nakano, H. Sato, T. Kin, K. Hamada, M. Tampo, Y. Miyake
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Measurement and Mechanism Investigation of Negative and Positive Muon Induced Upsets in 65nm Bulk SRAMs
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Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
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October 2017
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International Conference
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S. Manabe, Y. Watanabe, W. Liao, M. Hashimoto, K. Nakano, H. Sato, T. Kin, K. Hamada, M. Tampo, Y. Miyake
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Momentum and Supply Voltage Dependencies of SEUs Induced by Low-Energy Negative and Positive Muons in 65-nm UTBB-SOI SRAMs
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Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
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October 2017
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