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6 件の該当がありました. : このページのURL : HTML


論文誌
[1] J. Kuroda, S. Manabe, Y. Watanabe, K. Ito, W. Liao, M. Hashimoto, S. Abe, M. Harada, K. Oikawa, and Y. Miyake, "Measurement of Single-Event Upsets in 65-nm SRAMs under Irradiation of Spallation Neutrons at J-PARC MLF," IEEE Transactions on Nuclear Science, volume 67, number 7, 1599 -- 1605, July 2020. [pdf]
国際会議
[1] S. Abe, T. Sato, J. Kuroda, S. Manabe, Y. Watanabe, W. Liao, K. Ito, M. Hashimoto, M. Harada, K. Oikawa, and Y. Miyake, "Impact of Hydrided and Non-Hydrided Materials Near Transistors on Neutron-Induced Single Event Upsets," Proceedings of International Symposium on Reliability Physics (IRPS), April 2020. [pdf]
[2] K. Ito, W. Liao, M. Hashimoto, J. Kuroda, S. Manabe, Y. Watanabe, S. Abe, M. Harada, K. Oikawa, and Y. Miyake, "Characterizing Neutron-Induced SDC Rate of Matrix Multiplication in Tesla P4 GPU," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), September 2019.
[3] J. Kuroda, S. Manabe, Y. Watanabe, K. Ito, W. Liao, M. Hashimoto, S. Abe, M. Harada, K. Oikawa, and Y. Miyake, "Measurement of Single-Event Upsets in 65-nm Bulk SRAMs under Irradiation of Spallation Neutrons at J-PARC MLF," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), September 2019.
[4] S. Iizuka, M. Mizuno, D. Kuroda, M. Hashimoto, and T. Onoye, "Stochastic Error Rate Estimation for Adaptive Speed Control with Field Delay Testing," Proceedings of International Conference on Computer-Aided Design (ICCAD), pages 107--114, November 2013. [193.PDF]
研究会・全国大会等
[1] 橋本昌宜, 橋本鉄太郎, 西川亮太, 福田大輔, 黒田慎介, 菅俊介, 神原弘之, 小野寺秀俊, "オンデマンドライブラリを用いたシステムLSI詳細設計手法," 電子情報通信学会VLSI設計技術研究会, number VLD99-112/ICD99-269, 2000年3月.