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International Conference
[1] Quan Cheng, Hao-Yang Chi, Chien-Hsing Liang, Yu-Hong Chao, Huizi Zhang, Yuan Liang, Mingtao Zhang, Wang Liao, Jinjun Xiong, Jing-Jia Liou, Masanori Hashimoto, and Longyang Lin, "Genshin: a Generalized Framework with Software-Hardware Co-Design and Pruned Fault Injection for Reliability Analysis," Proceedings of International Test Conference (ITC), September 2025. [pdf]