Search: 簡易 | 詳細 || Language: 英語 | 日本語 || ログイン |

LaTeX list of works

52 件の該当がありました． : このページのURL : HTML

下のフィールドに表示された内容をエディタなどにコピー＆ペーストして，LaTeXをかけてください．
オプション設定でPDFのオンライン生成を許可している場合は，上方のどこかにPDFというリンクができています．

\documentclass{jarticle}
\usepackage{times}
\usepackage{fancyhdr}
\renewcommand{\baselinestretch}{0.85}
\setlength{\topmargin}{-10mm}
\setlength{\oddsidemargin}{0mm}
\setlength{\evensidemargin}{0mm}
\setlength{\textheight}{23.6cm}
\setlength{\textwidth}{16cm}
\title{\LARGE\bf 研究業績リスト}

\newcommand{\myName}{} %ここに名前が挿入される
\newcommand{\myAffiliation}{} %ここに所属が挿入される
\newcommand{\myTitle}{} %ここに肩書きが挿入される
\author{ \myAffiliation ~~ \myTitle  ~~ \myName }

\begin{document}
\maketitle

\pagestyle{fancy}
\thispagestyle{fancy}

\renewcommand{\headrulewidth}{0.5pt}
\renewcommand{\footrulewidth}{0.5pt}
\renewcommand{\sectionmark}[1]{\markright{#1}}
\fancyhf{}
\fancyhead[CE,CO]{\bf 研究業績リスト}
\fancyhead[RE,LO]{\bf \rightmark}
\fancyfoot[LE,RO]{\thepage}

\section{論文誌}
\label{sec:0}

\renewcommand{\labelenumi}{[\ref{sec:0}.\arabic{enumi}]}
\begin{enumerate}
\item
Y. Gomi, K. Takami, R. Mizuno, M. Niikura, R. Yasuda, Y. Deng, S. Kawase, Y. Watanabe, S. Abe, W. Liao, M. Tampo, S. Takeshita, K. Shimomura, Y. Miyake, and M. Hashimoto, ``Muon-Induced {SEU} Analysis and Simulation for Different Cell Types in {12-nm} {FinFET} {SRAMs}, and {28-nm} Planar {SRAMs} and Register Files,'' IEEE Transactions on Nuclear Science,    採録済.
\item
K. Takami, Y. Gomi, R. Yasuda, S. Abe, M. Itoh, H. Kanda, M. Fukuda, and M. Hashimoto, ``Validating Terrestrial {SER} in 12-, 28- and {65-nm} {SRAMs} Estimated by Simulation Coupled with One-Time Neutron Irradiation,'' IEEE Transactions on Nuclear Science, volume 72, number 8, pages 2622-2628, August 2025.
\item
Y. Li, M. Yoshida, Y. Gomi, Y. Deng, Y. Watanabe, S. Adachi, M. Itoh, G. Zhang, C. He, and M. Hashimoto, ``Experimental Study of Proton-Induced Radiation Effects on {DDR5} Modules,'' IEEE Transactions on Nuclear Science, volume 72, number 6, pages 1907-1918, June 2025.
\item
Y. Deng, Y. Watanabe, S. Manabe, W. Liao, M. Hashimoto, S. Abe, M. Tampo, and Y. Miyake, ``Impact of Irradiation Side on Muon-Induced Single Event Upsets in {65-nm} Bulk {SRAMs},'' IEEE Transactions on Nuclear Science, volume 71, number 4, pages 912-920, April 2024.
\item
S. Abe, M. Hashimoto, W. Liao, T. Kato, H. Asai, K. Shimbo, H. Matsuyama, T. Sato, K. Kobayashi, and Y. Watanabe, ``A Terrestrial {SER} Estimation Methodology Based on Simulation Coupled with One-Time Neutron Irradiation Testing,'' IEEE Transactions on Nuclear Science, volume 70, number 8, 1652 -- 1657, August 2023.
\item
W. Liao, K. Ito, S. Abe, Y. Mitsuyama, and M. Hashimoto, ``Characterizing Energetic Dependence of {Low-energy} {Neutron-induced} {SEU} and {MCU} and Its Influence on Estimation of Terrestrial {SER} in 65 {nm} Bulk {SRAM},'' IEEE Transactions on Nuclear Science, volume 68, number 6, pages 1228-1234, June 2021.
\item
T. Mahara, S. Manabe, Y. Watanabe, W. Liao, M. Hashimoto, T. Y. Saito, M. Niikura, K. Ninomiya, D. Tomono, and A. Sato, ``Irradiation Test of 65 {nm} Bulk {SRAMs} with {DC} Muon Beam at {RCNP} {MuSIC} Facility,'' IEEE Transactions on Nuclear Science, volume 67, number 7, 1555 -- 1559, July 2020.
\item
W. Liao, M. Hashimoto, S. Manabe, Y. Watanabe, S. Abe, M. Tampo, S. Takeshita, and Y. Miyake, ``Impact of the Angle of Incidence on Negative Muon-Induced {SEU} Cross Sections of {65-nm} Bulk and {FDSOI} {SRAMs},'' IEEE Transactions on Nuclear Science, volume 67, number 7, 1566 -- 1572, July 2020.
\item
J. Kuroda, S. Manabe, Y. Watanabe, K. Ito, W. Liao, M. Hashimoto, S. Abe, M. Harada, K. Oikawa, and Y. Miyake, ``Measurement of Single-Event Upsets in {65-nm} {SRAMs} under Irradiation of Spallation Neutrons at {J-PARC} {MLF},'' IEEE Transactions on Nuclear Science, volume 67, number 7, 1599 -- 1605, July 2020.
\item
M. Hashimoto, K. Kobayashi, J. Furuta, S. Abe, and Y. Watanabe, ``Characterizing {SRAM} and {FF} Soft Error Rates with Measurement and Simulation (Invited),'' Integration, the VLSI Journal, volume 69, pages 161--179, November 2019.
\item
S. Abe, W. Liao, S. Manabe, T. Sato, M. Hashimoto, and Y.  Watanabe, ``Impact of Irradiation Side on Neutron-Induced Single Event Upsets in {65-nm} Bulk {SRAMs},'' IEEE Transactions on Nuclear Science, volume 66, number 7, 1374 -- 1380, July 2019.
\item
W. Liao, M. Hashimoto, S. Manabe, S. Abe, and Y. Watanabe, ``Similarity Analysis on Neutron- and Negative Moun-Induced {MCUs} in {65-nm} Bulk {SRAM},'' IEEE Transactions on Nuclear Science, volume 66, number 7, 1390 -- 1397, July 2019.
\item
S. Manabe, Y. Watanabe, W. Liao, M. Hashimoto, and S. Abe, ``Estimation of Muon-Induced {SEU} Rates for {65-nm} Bulk and {UTBB-SOI} {SRAMs},'' IEEE Transactions on Nuclear Science, volume 66, number 7, 1398 -- 1403, July 2019.
\item
S. Manabe, Y. Watanabe, W. Liao, M. Hashimoto, K. Nakano, H. Sato, T. Kin, S. Abe, K. Hamada, M. Tampo, and Y. Miyake, ``Negative and Positive Muon-Induced Single Event Upsets in {65-nm} {UTBB} {SOI} {SRAMs},'' IEEE Transactions on Nuclear Science, volume 65, number 8, pages 1742--1749, August 2018.
\item
W. Liao, M. Hashimoto, S. Manabe, Y. Watanabe, K. Nakano, H. Sato, T. Kin, K. Hamada, M. Tampo, and Y. Miyake, ``Measurement and Mechanism Investigation of Negative and Positive Muon-Induced Upsets in {65-nm} Bulk {SRAMs},'' IEEE Transactions on Nuclear Science, volume 65, number 8, pages 1734--1741, August 2018.
\item
R. Harada, S. Abe, H. Fuketa, T. Uemura, M. Hashimoto, and Y. Watanabe, ``Angular Dependency of Neutron Induced Multiple Cell Upsets in {65-nm} {10T} Subthreshold {SRAM},'' IEEE Transactions on Nuclear Science, volume 59, number 6, pages 2791--2795, December 2012.
\item
T. Enami, K. Shinkai, S. Ninomiya, S. Abe, and M. Hashimoto, ``Statistical Timing Analysis Considering Clock Jitter  and Skew Due to Power Supply Noise and Process  Variation,'' IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E93-A, number 12, pages 2399--2408, December 2010.
\item
S. Abe, M. Hashimoto, and T. Onoye, ``Clock Skew Evaluation Considering Manufacturing Variability in Mesh-Style Clock Distribution,'' IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E91-A, number 12, pages 3481-3487, December 2008.
\end{enumerate}
\section{国際会議}
\label{sec:1}

\renewcommand{\labelenumi}{[\ref{sec:1}.\arabic{enumi}]}
\begin{enumerate}
\item
Y. Gomi, K. Takami, R. Mizuno, M. Niikura, R. Yasuda, Y. Deng, S. Kawase, Y. Watanabe, S. Abe, W. Liao, M. Tampo, S. Takeshita, K. Shimomura, Y. Miyake, and M. Hashimoto, ``Muon-Induced {SEU} Analysis and Simulation for Different Cell Types in {12-nm} {FinFET} {SRAMs},'' Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS),   September 2024.
\item
K. Takami, Y. Gomi, R. Yasuda, S. Abe, M. Itoh, H. Kanda, M. Fukuda, and M. Hashimoto, ``Validating Terrestrial {SER} in 12- and {28-nm} {SRAMs} Estimated by Simulation Coupled with One-Time Neutron Irradiation,'' Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS),   September 2024.
\item
R. Mizuno, M. Niikura, T. Y. Saito, T. Matsuzaki, S. Abe, H. Fukuda, M. Hashimoto, K. Ishida, N. Kawamura, S. Kawase, M. Oishi, P. Strasser, A. Sato, K. Shimomura, S. Takeshita, I. Umegaki, A. Hillier, T. Kawata, K. Kitafuji, Y. Yamaguchi, D. Tomono, and F. Minato, ``In-Beam Activation Measurement of Muon Nuclear Capture Reaction on Si Isotopes,'' The workshop on frontier nuclear studies with gamma-ray spectrometer arrays (gamma24),   March 2024.
\item
R. Mizuno, M. Niikura, T. Y. Saito, T. Matsuzaki, S. Abe, H. Fukuda, M. Hashimoto, K. Ishida, N. Kawamura, S. Kawase, M. Oishi, P. Strasser, A. Sato, K. Shimomura, S. Takeshita, I. Umegaki, A. Hillier, T. Kawata, K. Kitafuji, Y. Yamaguchi, D. Tomono, and F. Minato, ``Muon Nuclear Capture Reaction on 28,29,30si,'' 2023 Fall meeting of APS DNP and JPS,   November 2023.
\item
Y. Gomi, K. Takami, R. Mizuno, M. Niikura, Y. Deng, S. Kawase, Y. Watanabe, S. Abe, W. Liao, M. Tampo, I. Umegaki, S. Takeshita, K. Shimomura, Y. Miyake, and M. Hashimoto, ``Muon-Induced {SEU} Cross Sections of {12-nm} {FinFET} and {28-nm} Planar {SRAMs},'' Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS),   September 2023.
\item
M. Niikura, R. Mizuno, S. Manabe, T. Y. Saito, T. Matsuzaki, S. Abe, H. Fukuda, M. Hashimoto, K. Ishida, A. Hillier, N. Kawamura, Y. Kawashima, S. Kawase, T. Kawata, K. Kitafuji, F. Minato, M. Oishi, P. Strasser, A. Sato, K. Shimomura, S. Takeshita, M. Tampo, D. Tomono, I. Umegaki, Y. Yamaguchi, and Y. Watanabe, ``Nuclear Physics for Muon-Induced Soft Error,'' Workshop for Computational Technique for Negative Muon Spectroscopy and Elemental Analysis,   August 2023.
\item
R. Mizuno, M. Niikura, T. Y. Saito, S. Abe, H. Fukuda, M. Hashimoto, K. Ishida, N. Kawamura, S. Kawase, T. Matsuzaki, M. Oishi, P. Strasser, A. Sato, K. Shimomura, S. Takeshita, and I. Umegaki, ``Study of Muon Capture Reaction on Si Via In-Beam Muon Activation,'' Advances in Radioactive Isotope Science (ARIS),   June 2023.
\item
K. Takami, Y. Gomi, S. Abe, W. Liao, S. Manabe, T. Matsumoto, and M. Hashimoto, ``Characterizing {SEU} Cross Sections of 12- and {28-nm} {SRAMs} for 6.0, 8.0, and 14.8 {MeV} Neutrons,'' Proceedings of International Reliability Physics Symposium (IRPS),   March 2023.
\item
R. Mizuno, M. Niikura, T. Y. Saito, S. Abe, H. Fukuda, M. Hashimoto, K. Ishida, N. Kawamura, S. Kawase, T. Matsuzaki, M. Oishi, P. Strasser, A. Sato, K. Shimomura, S. Takeshita, and I. Umegaki, ``Study of Muon Capture Reaction on Si Via In-Beam Muon Activation,'' Topical Workshops on Modern Aspects of Nuclear Structure,   February 2023.
\item
R. Mizuno, M. Niikura, T. Y. Saito, S. Abe, H. Fukuda, M. Hashimoto, K. Ishida, N. Kawamura, S. Kawase, T. Matsuzaki, M. Oishi, P. Strasser, A. Sato, K. Shimomura, S. Takeshita, and I. Umegaki, ``Measurement of Muon-Induced Nuclear Transmutation for Si Isotopes,'' Trans-scale Quantum Science Institute,   November 2022.
\item
S. Abe, M. Hashimoto, W. Liao, T. Kato, H. Asai, K. Shimbo, H. Matsuyama, T. Sato, K. Kobayashi, and Y. Watanabe, ``A Terrestrial {SER} Estimation Methodology with Simulation and Single-Source Irradiation Applicable to Diverse Neutron Sources,'' Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS),   October 2022.
\item
S. Abe, T. Sato, J. Kuroda, S. Manabe, Y. Watanabe, W. Liao, K. Ito, M. Hashimoto, M. Harada, K. Oikawa, and Y. Miyake, ``Impact of Hydrided and Non-Hydrided Materials Near Transistors on Neutron-Induced Single Event Upsets,'' Proceedings of International Symposium on Reliability Physics (IRPS),   April 2020.
\item
T. Mahara, S. Manabe, Y. Watanabe, W. Liao, M. Hashimoto, T. Y. Saito, M. Niikura, K. Ninomiya, D. Tomono, and A. Sato, ``Irradiation Test of {65-nm} Bulk {SRAMs} with {DC} Muon Beam at {RCNP-MuSIC} Facility,'' Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS),   September 2019.
\item
K. Ito, W. Liao, M. Hashimoto, J. Kuroda, S. Manabe, Y. Watanabe, S. Abe, M. Harada, K. Oikawa, and Y. Miyake, ``Characterizing Neutron-Induced {SDC} Rate of Matrix Multiplication in Tesla P4 {GPU},'' Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS),   September 2019.
\item
W. Liao, M. Hashimoto, S. Manabe, Y. Watanabe, S. Abe, M. Tampo, S. Takeshita, and Y. Miyake, ``Impact of Incident Angle on Negative Muon-Induced {SEU} Cross Section of {65-nm} Bulk {SRAM},'' Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS),   September 2019.
\item
J. Kuroda, S. Manabe, Y. Watanabe, K. Ito, W. Liao, M. Hashimoto, S. Abe, M. Harada, K. Oikawa, and Y. Miyake, ``Measurement of Single-Event Upsets in {65-nm} Bulk {SRAMs} under Irradiation of Spallation Neutrons at {J-PARC} {MLF},'' Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS),   September 2019.
\item
W. Liao, M. Hashimoto, S. Manabe, Y. Watanabe, S. Abe, M. Tampo, S. Takeshita, and Y. Miyake, ``Negative and Positive Muon-Induced {SEU} Cross Sections in {28-nm} and {65-nm} Planar Bulk {CMOS} {SRAMs},'' Proceedings of International Reliability Physics Symposium (IRPS),   April 2019.
\item
M. Hashimoto, W. Liao, S. Manabe, and Y. Watanabe, ``Characterizing Soft Error Rates of {65-nm} {SOTB} and Bulk {SRAMs} with Muon and Neutron Beams (Invited),'' Proceedings of SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S),   October 2018.
\item
S. Manabe, Y. Watanabe, W. Liao, M. Hashimoto, and S. Abe, ``Estimation of Muon-Induced {SEU} Rates for {65-nm} Bulk and {UTBB-SOI} {SRAMs},'' Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS),   September 2018.
\item
W. Liao, M. Hashimoto, S. Manabe, S. Abe, and Y. Watanabe, ``Similarity Analysis on Neutron- and Negative Moun-Induced {MCUs} in {65-nm} Bulk {SRAM},'' Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS),   September 2018.
\item
S. Abe, W. Liao, S. Manabe, T. Sato, M. Hashimoto, and Y. Watanabe, ``Impact of Irradiation Side on Neutron-Induced Single Event Upsets in {65-nm} Bulk {SRAMs},'' Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS),   September 2018.
\item
W. Liao, M. Hashimoto, S. Manabe, Y. Watanabe, K. Nakano, H. Sato, T. Kin, K. Hamada, M. Tampo, and Y. Miyake, ``Measurement and Mechanism Investigation of Negative and Positive Muon Induced Upsets in 65nm Bulk {SRAMs},'' Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS),   October 2017.
\item
S. Manabe, Y. Watanabe, W. Liao, M. Hashimoto, K. Nakano, H. Sato, T. Kin, K. Hamada, M. Tampo, and Y. Miyake, ``Momentum and Supply Voltage Dependencies of {SEUs} Induced by Low-Energy Negative and Positive Muons in {65-nm} {UTBB-SOI} {SRAMs},'' Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS),   October 2017.
\item
S. Hirokawa, R. Harada, K. Sakuta, Y. Watanabe, and M. Hashimoto, ``Multiple Sensitive Volume Based Soft Error Rate Estimation with Machine Learning,'' Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS),   September 2016.
\item
S. Hirokawa, R. Harada, M. Hashimoto, K. Sakuta, and Y. Watanabe, ``Neutron-Induced {SEU} and {MCU} Rate Characterization and Analysis of {SOTB} and Bulk {SRAMs} at {0.3V} Operation,'' IEEE Nuclear and Space Radiation Effects Conference (NSREC),   July 2015.
\item
R. Harada, S. Abe, H. Fuketa, T. Uemura, M. Hashimoto, and Y. Watanabe, ``Angular Dependency of Neutron Induced Multiple Cell Upsets in {65-nm} {10T} Subthreshold {SRAM},'' IEEE Nuclear and Space Radiation Effects Conference (NSREC),   July 2012.
\item
S. Abe, K. Shinkai, M. Hashimoto, and T. Onoye, ``Clock Skew Reduction by Self-Compensating Manufacturing Variability with On-Chip Sensors,'' ACM Great Lake Symposium on VLSI (GLSVLSI),  pages 197--202, May 2010.
\item
T. Enami, K. Shinkai, S. Ninomiya, S. Abe, and M. Hashimoto, ``Statistical Timing Analysis Considering Clock Jitter and Skew Due to Power Supply Noise and Process Variation,'' ACM International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU),  pages 41--46, March 2010.
\item
S. Abe, K. Shinkai, M. Hashimoto, and T. Onoye, ``Clock Skew Reduction by Self-Compensating Manufacturing Variability with On-Chip Sensors,'' ACM International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU),  pages 89--94, March 2010.
\item
S. Watanabe, M. Hashimoto, and T. Sato, ``A Case for Exploiting Complex Arithmetic Circuits Towards Performance Yield Enhancement,'' Proceedings of International Symposium on Quality Electronic Design (ISQED),  pages 401--407, March 2009.
\item
S. Watanabe, M. Hashimoto, and T. Sato, ``Cascading Dependent Operations for Mitigating Timing Variability,'' Proceedings. of Workshop on Quality-Aware Design (W-QUAD),   June 2008.
\item
S. Abe, M. Hashimoto, and T. Onoye, ``Clock Skew Evaluation Considering Manufacturing Variability in Mesh-Style Clock Distribution,'' Proceedings of International Symposium on Quality Electronic Design (ISQED),  pages 520--525, March 2008.
\end{enumerate}
\section{研究会・全国大会等}
\label{sec:3}

\renewcommand{\labelenumi}{[\ref{sec:3}.\arabic{enumi}]}
\begin{enumerate}
\item
R. Mizuno, M. Niikura, T. Y. Saito, T. Matsuzaki, S. Abe, H. Fukuda, M. Hashimoto, K. Ishida, N. Kawamura, S. Kawase, M. Oishi, P. Strasser, A. Sato, K. Shimomura, S. Takeshita, I. Umegaki, A. Hillier, T. Kawata, K. Kitafuji, and D. Tomono, ``ミューオン原子核捕獲反応による生成核分岐比の測定,'' 第12回停止・低速RIビームを用いた核分光研究会 (12th SSRI),   September 2023.
\item
小笠原泰弘, 新開健一, 榎並孝司, 阿部慎也, 二宮進有, 橋本昌宜, ``ナノメートル世代のvlsiタイミング設計技術の研究,''  第10回システムLSIワークショップ,  pages 195-198, 2006年11月.
\end{enumerate}
以上．
\end{document}