Search: 簡易 | 詳細 || Language: 英語 | 日本語 || ログイン |

BibTeX list of works

55 件の該当がありました． : このページのURL : HTML

@article{id680,
         title = {Measurement of production branching ratio after muon nuclear capture reaction of Al and Si isotopes},
        author = {R. Mizuno and M. Niikura and T.Y. Saito and T. Matsuzaki and S. Abe and H. Fukuda and M. Hashimoto and A. Hillier and K. Ishida and N. Kawamura and S. Kawase and T. Kawata and K. Kitafuji and F. Minato and M. Oishi and A. Sato and K. Shimomura and P. Strasser and S. Takeshita and D. Tomono and Y. Watanabe},
       journal = {Physical Review C},
        volume = {112},
        number = {26},
         pages = {054305},
         month = {11},
          year = {2025},
}

@article{id654,
         title = {Validating Terrestrial {SER} in 12-, 28- and {65-nm} {SRAMs} Estimated by Simulation Coupled with One-Time Neutron Irradiation},
        author = {K. Takami and Y. Gomi and R. Yasuda and S. Abe and M. Itoh and H. Kanda and M. Fukuda and M. Hashimoto},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {72},
        number = {8},
         pages = {2622-2628},
         month = {8},
          year = {2025},
}

@article{id655,
         title = {Muon-Induced {SEU} Analysis and Simulation for Different Cell Types in {12-nm} {FinFET} {SRAMs}, and {28-nm} Planar {SRAMs} and Register Files},
        author = {Y. Gomi and K. Takami and R. Mizuno and M. Niikura and R. Yasuda and Y. Deng and S. Kawase and Y. Watanabe and S. Abe and W. Liao and M. Tampo and S. Takeshita and K. Shimomura and Y. Miyake and M. Hashimoto},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {72},
        number = {8},
         pages = {2751 - 2762},
         month = {8},
          year = {2025},
}

@article{id658,
         title = {Experimental Study of Proton-Induced Radiation Effects on {DDR5} Modules},
        author = {Y. Li and M. Yoshida and Y. Gomi and Y. Deng and Y. Watanabe and S. Adachi and M. Itoh and G. Zhang and C. He and M. Hashimoto},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {72},
        number = {6},
         pages = {1907-1918},
         month = {6},
          year = {2025},
}

@article{id629,
         title = {Impact of Irradiation Side on Muon-Induced Single Event Upsets in {65-nm} Bulk {SRAMs}},
        author = {Y. Deng and Y. Watanabe and S. Manabe and W. Liao and M. Hashimoto and S. Abe and M. Tampo and Y. Miyake},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {71},
        number = {4},
         pages = {912-920},
         month = {4},
          year = {2024},
}

@article{id613,
         title = {A Terrestrial {SER} Estimation Methodology based on Simulation coupled with One-Time Neutron Irradiation Testing},
        author = {S. Abe and M. Hashimoto and W. Liao and T. Kato and H. Asai and K. Shimbo and H. Matsuyama and T. Sato and K. Kobayashi and Y. Watanabe},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {70},
        number = {8},
         pages = {1652 -- 1657},
         month = {8},
          year = {2023},
}

@article{id571,
         title = {Characterizing Energetic Dependence of {Low-energy} {Neutron-induced} {SEU} and {MCU} and Its Influence on Estimation of Terrestrial {SER} in 65 {nm} Bulk {SRAM}},
        author = {W. Liao and K. Ito and S. Abe and Y. Mitsuyama and M. Hashimoto},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {68},
        number = {6},
         pages = {1228-1234},
         month = {6},
          year = {2021},
}

@article{id535,
         title = {Irradiation Test of 65 {nm} Bulk {SRAMs} with {DC} Muon Beam at {RCNP} {MuSIC} Facility},
        author = {T. Mahara and S. Manabe and Y. Watanabe and W. Liao and M. Hashimoto and T. Y. Saito and M. Niikura and K. Ninomiya and D. Tomono and A. Sato},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {67},
        number = {7},
         pages = {1555 -- 1559},
         month = {7},
          year = {2020},
}

@article{id540,
         title = {Impact of the Angle of Incidence on Negative Muon-induced {SEU} Cross Sections of {65-nm} Bulk and {FDSOI} {SRAMs}},
        author = {W. Liao and M. Hashimoto and S. Manabe and Y. Watanabe and S. Abe and M. Tampo and S. Takeshita and Y. Miyake},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {67},
        number = {7},
         pages = {1566 -- 1572},
         month = {7},
          year = {2020},
}

@article{id543,
         title = {Measurement of Single-Event Upsets in {65-nm} {SRAMs} Under Irradiation of Spallation Neutrons at {J-PARC} {MLF}},
        author = {J. Kuroda and S. Manabe and Y. Watanabe and K. Ito and W. Liao and M. Hashimoto and S. Abe and M. Harada and K. Oikawa and Y. Miyake},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {67},
        number = {7},
         pages = {1599 -- 1605},
         month = {7},
          year = {2020},
}

@article{id508,
         title = {Characterizing {SRAM} and {FF} Soft Error Rates with Measurement and Simulation (Invited)},
        author = {M. Hashimoto and K. Kobayashi and J. Furuta and S. Abe and Y. Watanabe},
       journal = {Integration, the VLSI Journal},
        volume = {69},
         pages = {161--179},
         month = {11},
          year = {2019},
}

@article{id506,
         title = {Impact of Irradiation Side on Neutron-induced Single Event Upsets in {65-nm} Bulk {SRAMs}},
        author = {S. Abe and W. Liao and S. Manabe and T. Sato and M. Hashimoto and Y.  Watanabe},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {66},
        number = {7},
         pages = {1374 -- 1380},
         month = {7},
          year = {2019},
}

@article{id509,
         title = {Similarity analysis on neutron- and negative moun-induced {MCUs} in {65-nm} bulk {SRAM}},
        author = {W. Liao and M. Hashimoto and S. Manabe and S. Abe and Y. Watanabe},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {66},
        number = {7},
         pages = {1390 -- 1397},
         month = {7},
          year = {2019},
}

@article{id511,
         title = {Estimation of Muon-Induced {SEU} Rates for {65-nm} Bulk and {UTBB-SOI} {SRAMs}},
        author = {S. Manabe and Y. Watanabe and W. Liao and M. Hashimoto and S. Abe},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {66},
        number = {7},
         pages = {1398 -- 1403},
         month = {7},
          year = {2019},
}

@article{id476,
         title = {Negative and Positive Muon-Induced Single Event Upsets in {65-nm} {UTBB} {SOI} {SRAMs}},
        author = {S. Manabe and Y. Watanabe and W. Liao and M. Hashimoto and K. Nakano and H. Sato and T. Kin and S. Abe and K. Hamada and M. Tampo and Y. Miyake},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {65},
        number = {8},
         pages = {1742--1749},
         month = {8},
          year = {2018},
}

@article{id477,
         title = {Measurement and Mechanism Investigation of Negative and Positive Muon-Induced Upsets in {65-nm} Bulk {SRAMs}},
        author = {W. Liao and M. Hashimoto and S. Manabe and Y. Watanabe and K. Nakano and H. Sato and T. Kin and K. Hamada and M. Tampo and Y. Miyake},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {65},
        number = {8},
         pages = {1734--1741},
         month = {8},
          year = {2018},
}

@article{id332,
         title = {Angular Dependency of Neutron Induced Multiple Cell Upsets in {65-nm} {10T} Subthreshold {SRAM}},
        author = {R. Harada and S. Abe and H. Fuketa and T. Uemura and M. Hashimoto and Y. Watanabe},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {59},
        number = {6},
         pages = {2791--2795},
         month = {12},
          year = {2012},
}

@article{id277,
         title = {Statistical Timing Analysis Considering Clock Jitter  and Skew due to Power Supply Noise and Process  Variation},
        author = {T. Enami and K. Shinkai and S. Ninomiya and S. Abe and M. Hashimoto},
       journal = {IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences},
        volume = {E93-A},
        number = {12},
         pages = {2399--2408},
         month = {12},
          year = {2010},
}

@article{id218,
         title = {Clock Skew Evaluation Considering Manufacturing Variability in Mesh-Style Clock Distribution},
        author = {S. Abe and M. Hashimoto and T. Onoye},
       journal = {IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences},
        volume = {E91-A},
        number = {12},
         pages = {3481-3487},
         month = {12},
          year = {2008},
}

@article{id695,
         title = {Study of excited states populated by muon nuclear capture based on the production branching ratio measurement},
        author = {R. Mizuno and M. Niikura and T.Y. Saito and T. Matsuzaki and S. Abe and H. Fukuda and M.  Hashimoto and A. D. Hillier and K. Ishida and N. Kawamura and S. Kawase and T. Kawata and K. Kitafuji and F. Minato and M. Oishi and A. Sato and K. Shimomura and P. Strasser and S. Takeshita and D. Tomono and Y. Watanabe},
       journal = {The 8th international workshop on Compound-Nuclear Reactions and Related Topics (CNR*26)},
         month = {0},
          year = {(to appear)},
}

@article{id691,
         title = {Study of excited states populated by muon nuclear capture based on the production branching ratio  measurement},
        author = {R. Mizuno and M. Niikura and T.Y. Saito and T. Matsuzaki and S. Abe and H. Fukuda and M.  Hashimoto and A. D. Hillier and K. Ishida and N. Kawamura and S. Kawase and T. Kawata and K. Kitafuji and F. Minato and M. Oishi and A. Sato and K. Shimomura and P. Strasser and S. Takeshita and D. Tomono and Y. Watanabe},
       journal = {The 5th Conference on Advances in Radioactive Isotope Science (ARIS2026)},
         month = {2},
          year = {2026},
}

@article{id637,
         title = {Muon-induced {SEU} Analysis and Simulation for Different Cell Types in {12-nm} {FinFET} {SRAMs}},
        author = {Y. Gomi and K. Takami and R. Mizuno and M. Niikura and R. Yasuda and Y. Deng and S. Kawase and Y. Watanabe and S. Abe and W. Liao and M. Tampo and S. Takeshita and K. Shimomura and Y. Miyake and M. Hashimoto},
       journal = {Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)},
         month = {9},
          year = {2024},
}

@article{id639,
         title = {Validating Terrestrial {SER} in 12- and {28-nm} {SRAMs} Estimated by Simulation Coupled with One-Time Neutron Irradiation},
        author = {K. Takami and Y. Gomi and R. Yasuda and S. Abe and M. Itoh and H. Kanda and M. Fukuda and M. Hashimoto},
       journal = {Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)},
         month = {9},
          year = {2024},
}

@article{id634,
         title = {In-beam activation measurement of muon nuclear capture reaction on Si isotopes},
        author = {R. Mizuno and  M. Niikura and  T. Y. Saito and  T. Matsuzaki and  S. Abe and  H. Fukuda and  M. Hashimoto and  K. Ishida and  N. Kawamura and  S. Kawase and  M. Oishi and  P. Strasser and  A. Sato and  K. Shimomura and  S. Takeshita and  I. Umegaki and  A. Hillier and  T. Kawata and  K. Kitafuji and  Y. Yamaguchi and  D. Tomono and  F. Minato},
       journal = {The workshop on frontier nuclear studies with gamma-ray spectrometer arrays (gamma24)},
         month = {3},
          year = {2024},
}

@article{id633,
         title = {Muon nuclear capture reaction on 28,29,30Si},
        author = {R. Mizuno and  M. Niikura and  T. Y. Saito and  T. Matsuzaki and  S. Abe and  H. Fukuda and  M. Hashimoto and  K. Ishida and  N. Kawamura and  S. Kawase and  M. Oishi and  P. Strasser and  A. Sato and  K. Shimomura and  S. Takeshita and  I. Umegaki and  A. Hillier and  T. Kawata and  K. Kitafuji and  Y. Yamaguchi and  D. Tomono and  F. Minato},
       journal = {2023 Fall meeting of APS DNP and JPS},
         month = {11},
          year = {2023},
}

@article{id618,
         title = {Muon-Induced {SEU} Cross Sections of {12-nm} {FinFET} and {28-nm} Planar {SRAMs}},
        author = {Y. Gomi and K. Takami and R. Mizuno and M. Niikura and Y. Deng and S. Kawase and Y. Watanabe and S. Abe and W. Liao and M. Tampo and I. Umegaki and S. Takeshita and K. Shimomura and Y. Miyake and M. Hashimoto},
       journal = {Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)},
         month = {9},
          year = {2023},
}

@article{id632,
         title = {Nuclear physics for muon-induced soft error},
        author = {M. Niikura and   R. Mizuno and  S. Manabe and  T. Y. Saito and  T. Matsuzaki and  S. Abe and  H. Fukuda and  M. Hashimoto and  K. Ishida and  A. Hillier and  N. Kawamura and  Y. Kawashima and  S. Kawase and  T. Kawata and  K. Kitafuji and  F. Minato and  M. Oishi and  P. Strasser and  A. Sato and  K. Shimomura and  S. Takeshita and  M. Tampo and  D. Tomono and  I. Umegaki and  Y. Yamaguchi and  Y. Watanabe},
       journal = {Workshop for Computational Technique for Negative Muon Spectroscopy and Elemental Analysis},
         month = {8},
          year = {2023},
}

@article{id631,
         title = {Study of muon capture reaction on Si via in-beam muon activation},
        author = {R. Mizuno and  M. Niikura and  T. Y. Saito and  S. Abe and  H. Fukuda and  M. Hashimoto and  K. Ishida and  N. Kawamura and  S. Kawase and  T. Matsuzaki and  M. Oishi and  P. Strasser and  A. Sato and  K. Shimomura and  S. Takeshita and  I. Umegaki},
       journal = {Advances in Radioactive Isotope Science (ARIS)},
         month = {6},
          year = {2023},
}

@article{id606,
         title = {Characterizing {SEU} Cross Sections of 12- and {28-nm} {SRAMs} for 6.0, 8.0, and 14.8 {MeV} Neutrons},
        author = {K. Takami and Y. Gomi and S. Abe and W. Liao and S. Manabe and T. Matsumoto and M. Hashimoto},
       journal = {Proceedings of International Reliability Physics Symposium (IRPS)},
         month = {3},
          year = {2023},
}

@article{id610,
         title = {Study of muon capture reaction on Si via in-beam muon activation},
        author = {R. Mizuno and M. Niikura and T. Y. Saito and S. Abe and H. Fukuda and M. Hashimoto and K. Ishida and N. Kawamura and S. Kawase and T. Matsuzaki and M. Oishi and P. Strasser and A. Sato and K. Shimomura and S. Takeshita and I. Umegaki},
       journal = {Topical Workshops on Modern Aspects of Nuclear Structure},
         month = {2},
          year = {2023},
}

@article{id630,
         title = {Measurement of muon-induced nuclear transmutation for Si isotopes},
        author = {R. Mizuno and  M. Niikura and  T. Y. Saito and  S. Abe and  H. Fukuda and  M. Hashimoto and  K. Ishida and  N. Kawamura and  S. Kawase and  T. Matsuzaki and  M. Oishi and  P. Strasser and  A. Sato and  K. Shimomura and  S. Takeshita and  I. Umegaki},
       journal = {Trans-scale Quantum Science Institute},
         month = {11},
          year = {2022},
}

@article{id597,
         title = {A Terrestrial {SER} Estimation Methodology with Simulation and Single-Source Irradiation Applicable to Diverse Neutron Sources},
        author = {S. Abe and M. Hashimoto and W. Liao and T. Kato and H. Asai and K. Shimbo and H. Matsuyama and T. Sato and K. Kobayashi and Y. Watanabe},
       journal = {Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)},
         month = {10},
          year = {2022},
}

@article{id538,
         title = {Impact of Hydrided and Non-Hydrided Materials Near Transistors on Neutron-Induced Single Event Upsets},
        author = {S. Abe and T. Sato and J. Kuroda and S. Manabe and Y. Watanabe and W. Liao and K. Ito and M. Hashimoto and M. Harada and K. Oikawa and Y. Miyake},
       journal = {Proceedings of International Symposium on Reliability Physics (IRPS)},
         month = {4},
          year = {2020},
}

@article{id518,
         title = {Irradiation Test of {65-nm} Bulk {SRAMs} with {DC} Muon Beam at {RCNP-MuSIC} Facility},
        author = {T. Mahara and S. Manabe and Y. Watanabe and W. Liao and M. Hashimoto and T. Y. Saito and M. Niikura and K. Ninomiya and D. Tomono and A. Sato},
       journal = {Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)},
         month = {9},
          year = {2019},
}

@article{id519,
         title = {Characterizing Neutron-Induced {SDC} Rate of Matrix Multiplication in Tesla P4 {GPU}},
        author = {K. Ito and W. Liao and M. Hashimoto and J. Kuroda and S. Manabe and Y. Watanabe and S. Abe and M. Harada and K. Oikawa and Y. Miyake},
       journal = {Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)},
         month = {9},
          year = {2019},
}

@article{id520,
         title = {Impact of Incident Angle on Negative Muon-induced {SEU} Cross Section of {65-nm} Bulk {SRAM}},
        author = {W. Liao and M. Hashimoto and S. Manabe and Y. Watanabe and S. Abe and M. Tampo and S. Takeshita and Y. Miyake},
       journal = {Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)},
         month = {9},
          year = {2019},
}

@article{id521,
         title = {Measurement of Single-Event Upsets in {65-nm} Bulk {SRAMs} Under Irradiation of Spallation Neutrons at {J-PARC} {MLF}},
        author = {J. Kuroda and S. Manabe and Y. Watanabe and K. Ito and W. Liao and M. Hashimoto and S. Abe and M. Harada and K. Oikawa and Y. Miyake},
       journal = {Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)},
         month = {9},
          year = {2019},
}

@article{id500,
         title = {Negative and Positive Muon-induced {SEU} Cross Sections in {28-nm} and {65-nm} Planar Bulk {CMOS} {SRAMs}},
        author = {W. Liao and M. Hashimoto and S. Manabe and Y. Watanabe and S. Abe and M. Tampo and S. Takeshita and Y. Miyake},
       journal = {Proceedings of International Reliability Physics Symposium (IRPS)},
         month = {4},
          year = {2019},
}

@article{id496,
         title = {Characterizing soft error rates of {65-nm} {SOTB} and bulk {SRAMs} with muon and neutron beams (Invited)},
        author = {M. Hashimoto and W. Liao and S. Manabe and Y. Watanabe},
       journal = {Proceedings of SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)},
         month = {10},
          year = {2018},
}

@article{id482,
         title = {Estimation of Muon-Induced {SEU} Rates for {65-nm} Bulk and {UTBB-SOI} {SRAMs}},
        author = {S. Manabe and Y. Watanabe and W. Liao and M. Hashimoto and S. Abe},
       journal = {Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)},
         month = {9},
          year = {2018},
}

@article{id483,
         title = {Similarity analysis on neutron- and negative moun-induced {MCUs} in {65-nm} bulk {SRAM}},
        author = {W. Liao and M. Hashimoto and S. Manabe and S. Abe and Y. Watanabe},
       journal = {Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)},
         month = {9},
          year = {2018},
}

@article{id484,
         title = {Impact of Irradiation Side on Neutron-induced Single Event Upsets in {65-nm} Bulk {SRAMs}},
        author = {S. Abe and W. Liao and S. Manabe and T. Sato and M. Hashimoto and Y. Watanabe},
       journal = {Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)},
         month = {9},
          year = {2018},
}

@article{id453,
         title = {Measurement and Mechanism Investigation of Negative and Positive Muon Induced Upsets in 65nm Bulk {SRAMs}},
        author = {W. Liao and M. Hashimoto and S. Manabe and Y. Watanabe and K. Nakano and H. Sato and T. Kin and K. Hamada and M. Tampo and Y. Miyake},
       journal = {Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)},
         month = {10},
          year = {2017},
}

@article{id454,
         title = {Momentum and Supply Voltage Dependencies of {SEUs} Induced by Low-energy Negative and Positive Muons in {65-nm} {UTBB-SOI} {SRAMs}},
        author = {S. Manabe and Y. Watanabe and W. Liao and M. Hashimoto and K. Nakano and H. Sato and T. Kin and K. Hamada and M. Tampo and Y. Miyake},
       journal = {Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)},
         month = {10},
          year = {2017},
}

@article{id435,
         title = {Multiple Sensitive Volume Based Soft Error Rate Estimation with Machine Learning},
        author = {S. Hirokawa and R. Harada and K. Sakuta and Y. Watanabe and M. Hashimoto},
       journal = {Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)},
         month = {9},
          year = {2016},
}

@article{id413,
         title = {Neutron-Induced {SEU} and {MCU} Rate Characterization and Analysis of {SOTB} and Bulk {SRAMs} at {0.3V} Operation},
        author = {S. Hirokawa and R. Harada and M. Hashimoto and K. Sakuta and Y. Watanabe},
       journal = {IEEE Nuclear and Space Radiation Effects Conference (NSREC)},
         month = {7},
          year = {2015},
}

@article{id316,
         title = {Angular Dependency of Neutron Induced Multiple Cell Upsets in {65-nm} {10T} Subthreshold {SRAM}},
        author = {R. Harada and S. Abe and H. Fuketa and T. Uemura and M. Hashimoto and Y. Watanabe},
       journal = {IEEE Nuclear and Space Radiation Effects Conference (NSREC)},
         month = {7},
          year = {2012},
}

@article{id266,
         title = {Clock Skew Reduction by Self-Compensating Manufacturing Variability with On-chip Sensors},
        author = {S. Abe and K. Shinkai and M. Hashimoto and T. Onoye},
       journal = {ACM Great Lake Symposium on VLSI (GLSVLSI)},
         pages = {197--202},
         month = {5},
          year = {2010},
}

@article{id264,
         title = {Statistical Timing Analysis Considering Clock Jitter and Skew due to Power Supply Noise and Process Variation},
        author = {T. Enami and K. Shinkai and S. Ninomiya and S. Abe and M. Hashimoto},
       journal = {ACM International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU)},
         pages = {41--46},
         month = {3},
          year = {2010},
}

@article{id265,
         title = {Clock Skew Reduction by Self-Compensating Manufacturing Variability with On-chip Sensors},
        author = {S. Abe and K. Shinkai and M. Hashimoto and T. Onoye},
       journal = {ACM International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU)},
         pages = {89--94},
         month = {3},
          year = {2010},
}

@article{id229,
         title = {A Case for Exploiting Complex Arithmetic Circuits towards Performance Yield Enhancement},
        author = {S. Watanabe and M. Hashimoto and T. Sato},
       journal = {Proceedings of International Symposium on Quality Electronic Design (ISQED)},
         pages = {401--407},
         month = {3},
          year = {2009},
}

@article{id213,
         title = {Cascading Dependent Operations for Mitigating Timing Variability},
        author = {S. Watanabe and M. Hashimoto and T. Sato},
       journal = {Proceedings. of Workshop on Quality-Aware Design (W-QUAD)},
         month = {6},
          year = {2008},
}

@article{id199,
         title = {Clock Skew Evaluation Considering Manufacturing Variability in Mesh-Style Clock Distribution},
        author = {S. Abe and M. Hashimoto and T. Onoye},
       journal = {Proceedings of International Symposium on Quality Electronic Design (ISQED)},
         pages = {520--525},
         month = {3},
          year = {2008},
}

@article{id635,
         title = {ミューオン原子核捕獲反応による生成核分岐比の測定},
        author = {R. Mizuno and  M. Niikura and  T. Y. Saito and  T. Matsuzaki and  S. Abe and  H. Fukuda and  M. Hashimoto and  K. Ishida and  N. Kawamura and  S. Kawase and  M. Oishi and  P. Strasser and  A. Sato and  K. Shimomura and  S. Takeshita and  I. Umegaki and  A. Hillier and  T. Kawata and  K. Kitafuji and  D. Tomono},
       journal = {第12回停止・低速RIビームを用いた核分光研究会 (12th SSRI)},
         month = {9},
          year = {2023},
}

@inproceedings{id92,
         title = {ナノメートル世代のVLSIタイミング設計技術の研究},
        author = {小笠原泰弘 and 新開健一 and 榎並孝司 and 阿部慎也 and 二宮進有 and 橋本昌宜},
     booktitle = {第10回システムLSIワークショップ},
         pages = {195-198},
         month = {11},
          year = {2006},
}