Academic Journal
|
, , , , S. Abe, , M. Hashimoto, , , , , , , , , , , , , , Y. Watanabe
|
Measurement of Production Branching Ratio After Muon Nuclear Capture Reaction of Al and Si Isotopes
|
Physical Review C
| 112(26)
|
054305
|
November 2025
|
| pdf
|
Academic Journal
|
|
A 55-nm SRAM Chip Scanning Errors Every 125 ns for Event-Wise Soft Error Measurement
|
IEEE Solid-State Circuits Letters
| 8
|
245-248
|
September 2025
|
| pdf
|
Academic Journal
|
S. Abe, M. Hashimoto, W. Liao, T. Kato, , , H. Matsuyama, T. Sato, K. Kobayashi, Y. Watanabe
|
A Terrestrial SER Estimation Methodology Based on Simulation Coupled with One-Time Neutron Irradiation Testing
|
IEEE Transactions on Nuclear Science
| 70(8)
|
1652 -- 1657
|
August 2023
|
| pdf
|
Academic Journal
|
, S. Manabe, Y. Watanabe, W. Liao, M. Hashimoto
|
Irradiation Test of 65 nm Bulk SRAMs with DC Muon Beam at RCNP MuSIC Facility
|
IEEE Transactions on Nuclear Science
| 67(7)
|
1555 -- 1559
|
July 2020
|
| pdf
|
Academic Journal
|
S. Abe, W. Liao, S. Manabe, T. Sato, M. Hashimoto
|
Impact of Irradiation Side on Neutron-Induced Single Event Upsets in 65-nm Bulk SRAMs
|
IEEE Transactions on Nuclear Science
| 66(7)
|
1374 -- 1380
|
July 2019
|
| pdf
|
Academic Journal
|
S. Manabe, Y. Watanabe, W. Liao, M. Hashimoto, K. Nakano, H. Sato, T. Kin, S. Abe, K. Hamada, M. Tampo, Y. Miyake
|
Negative and Positive Muon-Induced Single Event Upsets in 65-nm UTBB SOI SRAMs
|
IEEE Transactions on Nuclear Science
| 65(8)
|
1742--1749
|
August 2018
|
| pdf
|
Academic Journal
|
W. Liao, M. Hashimoto, S. Manabe, Y. Watanabe, K. Nakano, H. Sato, T. Kin, K. Hamada, M. Tampo, Y. Miyake
|
Measurement and Mechanism Investigation of Negative and Positive Muon-Induced Upsets in 65-nm Bulk SRAMs
|
IEEE Transactions on Nuclear Science
| 65(8)
|
1734--1741
|
August 2018
|
| pdf
|
Academic Journal
|
Z. Huang, A. Kurokawa, M. Hashimoto, T. Sato, M. Jiang, Y. Inoue
|
Modeling the Overshooting Effect for CMOS Inverter Delay Analysis in Nanometer Technologies
|
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
| 29(2)
|
250--260
|
February 2010
|
| 134.pdf
|
Academic Journal
|
Y. Ogasahara, T. Enami, M. Hashimoto, T. Sato, T. Onoye
|
Validation of a Full-Chip Simulation Model for Supply Noise and Delay Dependence on Average Voltage Drop with On-Chip Delay Measurement
|
IEEE Transactions on Circuits and Systems II
| 54(10)
|
868--872
|
October 2007
|
| 94.pdf
|
Academic Journal
|
金本俊幾, 佐藤高史, 黒川敦, 川上善之, 岡宏規, 北浦智靖, 小林宏行, 橋本昌宜
|
遅延計算におけるインダクタンスを考慮すべき配線の統計的選別手法
|
情報処理学会論文誌
| 44(5)
|
1301-1310
|
May 2003
|
| 21.pdf
|
International Conference
|
, , , , S. Abe, , M. Hashimoto, , , , , , , , , , , , , , Y. Watanabe
|
Study of Excited States Populated by Muon Nuclear Capture Based on the Production Branching Ratio Measurement
|
The 5th Conference on Advances in Radioactive Isotope Science (ARIS2026)
|
|
|
(accepted, to appear)
|
|
|
International Conference
|
, , , , S. Abe, , M. Hashimoto, , , , , , , , , , , , , , Y. Watanabe
|
Study of Excited States Populated by Muon Nuclear Capture Based on the Production Branching Ratio Measurement
|
The 8th international workshop on Compound-Nuclear Reactions and Related Topics
|
|
|
(accepted, to appear)
|
|
|
International Conference
|
, , , , , , , , W. Liao, , T. Sato, , M. Hashimoto
|
A Radiation-Hardened Neuromorphic Imager with Self-Healing Spiking Pixels and Unified Spiking Neural Network for Space Robotics
|
Digest of Symposium on VLSI Technology and Circuits
|
|
|
June 2025
|
| pdf
|
International Conference
|
, , , , , , , , , T. Sato, , M. Hashimoto
|
A 22nm Resource-Frugal Hyper-Heterogeneous Multi-Modal System-On-Chip Towards In-Orbit Computing
|
Proceedings of IEEE Custom Integrated Circuits Conference (CICC)
|
|
|
April 2025
|
| pdf
|
International Conference
|
, , , , S. Abe, , M. Hashimoto
|
In-Beam Activation Measurement of Muon Nuclear Capture Reaction on Si Isotopes
|
The workshop on frontier nuclear studies with gamma-ray spectrometer arrays (gamma24)
|
|
|
March 2024
|
|
|
International Conference
|
, , , , S. Abe, , M. Hashimoto
|
Muon Nuclear Capture Reaction on 28,29,30si
|
2023 Fall meeting of APS DNP and JPS
|
|
|
November 2023
|
|
|
International Conference
|
, , S. Manabe, , , S. Abe, , M. Hashimoto, , , , , , , , , , , , , , M. Tampo, , , , Y. Watanabe
|
Nuclear Physics for Muon-Induced Soft Error
|
Workshop for Computational Technique for Negative Muon Spectroscopy and Elemental Analysis
|
|
|
August 2023
|
|
|
International Conference
|
, , , S. Abe, , M. Hashimoto
|
Study of Muon Capture Reaction on Si Via In-Beam Muon Activation
|
Advances in Radioactive Isotope Science (ARIS)
|
|
|
June 2023
|
|
|
International Conference
|
, , , S. Abe, , M. Hashimoto
|
Study of Muon Capture Reaction on Si Via In-Beam Muon Activation
|
Topical Workshops on Modern Aspects of Nuclear Structure
|
|
|
February 2023
|
|
|
International Conference
|
, , , S. Abe, , M. Hashimoto
|
Measurement of Muon-Induced Nuclear Transmutation for Si Isotopes
|
Trans-scale Quantum Science Institute
|
|
|
November 2022
|
|
|
International Conference
|
S. Abe, M. Hashimoto, W. Liao, T. Kato, , , H. Matsuyama, T. Sato, K. Kobayashi, Y. Watanabe
|
A Terrestrial SER Estimation Methodology with Simulation and Single-Source Irradiation Applicable to Diverse Neutron Sources
|
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
|
|
|
October 2022
|
|
|
International Conference
|
, , Y. Hayashi, , M. Hashimoto, T. Sato
|
SASIMI: Evaluation Board for EM Information Leakage from Large Scale Cryptographic Circuits
|
IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity
|
|
|
August 2022
|
| pdf
|
International Conference
|
S. Abe, T. Sato, , S. Manabe, Y. Watanabe, W. Liao, , M. Hashimoto, , , Y. Miyake
|
Impact of Hydrided and Non-Hydrided Materials Near Transistors on Neutron-Induced Single Event Upsets
|
Proceedings of International Symposium on Reliability Physics (IRPS)
|
|
|
April 2020
|
| pdf
|
International Conference
|
, S. Manabe, Y. Watanabe, W. Liao, M. Hashimoto
|
Irradiation Test of 65-nm Bulk SRAMs with DC Muon Beam at RCNP-MuSIC Facility
|
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
|
|
|
September 2019
|
|
|
International Conference
|
S. Abe, W. Liao, S. Manabe, T. Sato, M. Hashimoto, Y. Watanabe
|
Impact of Irradiation Side on Neutron-Induced Single Event Upsets in 65-nm Bulk SRAMs
|
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
|
|
|
September 2018
|
|
|
International Conference
|
W. Liao, M. Hashimoto, S. Manabe, Y. Watanabe, K. Nakano, H. Sato, T. Kin, K. Hamada, M. Tampo, Y. Miyake
|
Measurement and Mechanism Investigation of Negative and Positive Muon Induced Upsets in 65nm Bulk SRAMs
|
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
|
|
|
October 2017
|
|
|
International Conference
|
S. Manabe, Y. Watanabe, W. Liao, M. Hashimoto, K. Nakano, H. Sato, T. Kin, K. Hamada, M. Tampo, Y. Miyake
|
Momentum and Supply Voltage Dependencies of SEUs Induced by Low-Energy Negative and Positive Muons in 65-nm UTBB-SOI SRAMs
|
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
|
|
|
October 2017
|
|
|
International Conference
|
Y. Ogasahara, T. Enami, M. Hashimoto, T. Sato, T. Onoye
|
Measurement Results of Delay Degradation Due to Power Supply Noise Well Correlated with Full-Chip Simulation
|
Proceedings of IEEE Custom Integrated Circuits Conference (CICC),
|
|
861-864
|
September 2006
|
| 25.pdf
|
International Conference
|
T. Sato, T. Kanamoto, A. Kurokawa, Y. Kawakami, H. Oka, T. Kitaura, H. Kobayashi, M. Hashimoto
|
Accurate Prediction of the Impact of On-Chip Inductance on Interconnect Delay Using Electrical and Physical Parameters
|
Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC)
|
|
149-155
|
January 2003
|
| 40.pdf
|
Domestic Conference
|
金本 俊幾, 佐藤 高史, 黒川 敦, 川上 善之, 岡 宏規, 北浦 智靖, 池内 敦彦, 小林 宏行, 橋本 昌宜
|
0.1μm級LSIの遅延計算における寄生インダクタンスを考慮すべき配線の統計的選別手法
|
情報処理学会DAシンポジウム
|
|
149-154
|
July 2002
|
|
|
Domestic Conference
|
佐藤高史, 金本俊幾, 黒川敦, 川上善之, 岡宏規, 北浦智靖, 池内敦彦, 小林宏行, 橋本昌宜
|
インダクタンスが配線遅延に及ぼす影響の定量的評価方法
|
第15回 回路とシステム(軽井沢)ワークショップ
|
|
493-498
|
April 2002
|
|
|
Workshop
|
, , , , S. Abe, , M. Hashimoto
|
ミューオン原子核捕獲反応による生成核分岐比の測定
|
第12回停止・低速RIビームを用いた核分光研究会 (12th SSRI)
|
|
|
September 2023
|
|
|
Workshop
|
Y. Ogasahara, T. Enami, M. Hashimoto, T. Sato
|
電源ノイズによる遅延変動の測定とフルチップシミュレーションによる遅延変動の再現
|
電子情報通信学会 集積回路研究会,
| (ICD2006-174)
|
|
January 2007
|
|
|
Workshop
|
T. Sato, T. Kanamoto, A. Kurokawa, Y. Kawakami, H. Oka, T. Kitaura, A. Ikeuchi, H. Kobayashi, M. Hashimoto
|
インダクタンスに起因する配線遅延変動の統計的予測手法
|
2002年電子情報通信学会ソサイエティ大会講演論文集
| (TA-2-4)
|
247-248
|
September 2002
|
|
|
Book
|
T. Sato, M. Hashimoto, S. Tanakamaru, K. Takeuchi, Y. Sato, S. Kajihara, M. Yoshimoto, J. Jung, Y. Kimi, H. Kawaguchi, H. Shimada, J. Yao
|
Time-Dependent Degradation in Device Characteristics and Countermeasures by Design
|
Book chapter, VLSI Design and Test for Systems Dependability, Springer
|
|
|
August 2018
|
|
|
