この検索内の頻出タグ: measurement^:3 noise^:3 supply^:3 delay^:2 on-chip^:2 power^:2 verification^:2 average^:1 cells^:1 circuit^:1 composed^:1 correlation^:1 dependence^:1 drop^:1 due^:1 dynamic^:1 full-chip^:1 i/o^:1 in-site^:1 increase^:1 integrity^:1 magnitude^:1 model^:1 simulation^:1 soc^:1 sso^:1 standard^:1 suitable^:1 validation^:1 voltage^:1

20 件の該当がありました． : このページのURL : HTML

@article{id317,
         title = {Supply Noise Suppression by Triple-Well Structure},
        author = {Y. Ogasahara and M. Hashimoto and T. Kanamoto and T. Onoye},
       journal = {IEEE Transactions on VLSI Systems},
        volume = {21},
        number = {4},
         pages = {781--785},
         month = {4},
          year = {2013},
}

@article{id233,
         title = {All Digital Ring-Oscillator Based Macro for Sensing Dynamic Supply Noise Waveform},
        author = {Y. Ogasahara and M. Hashimoto and T. Onoye},
       journal = {IEEE Journal of Solid-State Circuits},
        volume = {44},
        number = {6},
         pages = {1745--1755},
         month = {6},
          year = {2009},
}

@article{id214,
         title = {Impact of Well Edge Proximity Effect on Timing},
        author = {T. Kanamoto and Y. Ogasahara and K. Natsume and K. Yamaguchi and H. Amishiro and T. Watanabe and M. Hashimoto},
       journal = {IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences},
        volume = {E91-A},
        number = {12},
         pages = {3461-3464},
         month = {12},
          year = {2008},
}

@article{id196,
         title = {Measurement and Analysis of Inductive Coupling Noise in 90nm Global Interconnects},
        author = {Y. Ogasahara and M. Hashimoto and T. Onoye},
       journal = {IEEE Journal of Solid-State Circuits},
        volume = {43},
        number = {3},
         pages = {718--728},
         month = {3},
          year = {2008},
}

@article{id180,
         title = {Validation of a Full-Chip Simulation Model for Supply Noise and Delay Dependence on Average Voltage Drop with On-chip Delay Measurement},
        author = {Y. Ogasahara and T. Enami and M. Hashimoto and T. Sato and T. Onoye},
       journal = {IEEE Transactions on Circuits and Systems II},
        volume = {54},
        number = {10},
         pages = {868--872},
         month = {10},
          year = {2007},
}

@article{id1,
         title = {Quantitative Prediction of On-Chip Capacitive and Inductive Crosstalk Noise and Tradeoff Between Wire Cross-Sectional Area and Inductive Crosstalk Effect},
        author = {Y. Ogasahara and M. Hashimoto and T. Onoye},
       journal = {IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences},
        volume = {E90-A},
        number = {4},
         pages = {724--731},
         month = {4},
          year = {2007},
}

@article{id270,
         title = {Measurement of On-chip I/O Power Supply Noise and Correlation Verification between Noise Magnitude and Delay Increase due to {SSO}},
        author = {Y. Takai and Y. Ogasahara and M. Hashimoto and T. Onoye},
       journal = {Proceedings of IEEE Workshop on Signal Propagation on Interconnects (SPI)},
         pages = {19--20},
         month = {5},
          year = {2010},
}

@article{id217,
         title = {Measurement of Supply Noise Suppression by Substrate and Deep N-well in 90nm Process},
        author = {Y. Ogasahara and M. Hashimoto and T. Kanamoto and T. Onoye},
       journal = {Proceedings of IEEE Asian Solid-State Circuits Conference (A-SSCC)},
         pages = {397--400},
         month = {11},
          year = {2008},
}

@article{id192,
         title = {Dynamic Supply Noise Measurement Circuit Composed of Standard Cells Suitable for In-Site {SoC} Power Integrity Verification},
        author = {Y. Ogasahara and M. Hashimoto and T. Onoye},
       journal = {Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC)},
         pages = {107--108},
         month = {1},
          year = {2008},
}

@article{id182,
         title = {Impact of Well Edge Proximity Effect on Timing},
        author = {T. Kanamoto and Y. Ogasahara and K. Natsume and K. Yamaguchi and H. Amishiro and T. Watanabe and M. Hashimoto},
       journal = {Proceedings of 37th European Solid-State Device Research Conference (ESSDERC)},
         pages = {115--118},
         month = {9},
          year = {2007},
}

@article{id183,
         title = {Dynamic Supply Noise Measurement with All Digital Gated Oscillator for Evaluating Decoupling Capacitance Effect},
        author = {Y. Ogasahara and M. Hashimoto and T. Onoye},
       journal = {Proceedings of IEEE Custom Integrated Circuits Conference (CICC)},
         pages = {783--786},
         month = {9},
          year = {2007},
}

@inproceedings{id31,
         title = {Quantitative Prediction of On-chip Capacitive and Inductive Crosstalk Noise and Discussion on Wire Cross-Sectional Area Toward Inductive Crosstalk Free Interconnects},
        author = {Y. Ogasahara and M. Hashimoto and T. Onoye},
     booktitle = {Proceedings of IEEE International Conference on Computer Design (ICCD)},
         pages = {70-75},
         month = {10},
          year = {2006},
}

@inproceedings{id32,
         title = {Measurement of Inductive Coupling Effect on Timing in 90nm Global Interconnects},
        author = {Y. Ogasahara and M. Hashimoto and T. Onoye},
     booktitle = {Proceedings of IEEE Custom Integrated Circuits Conference (CICC)},
         pages = {721-724},
         month = {9},
          year = {2006},
}

@inproceedings{id33,
         title = {Measurement results of delay degradation due to power supply noise well correlated with full-chip simulation},
        author = {Y. Ogasahara and T. Enami and M. Hashimoto and T. Sato and T. Onoye},
     booktitle = {Proceedings of IEEE Custom Integrated Circuits Conference (CICC),},
         pages = {861-864},
         month = {9},
          year = {2006},
}

@inproceedings{id43,
         title = {Measurement and Analysis of Delay Variation due to Inductive Coupling},
        author = {Y. Ogasahara and M. Hashimoto and T. Onoye},
     booktitle = {Proceedings of IEEE Custom Integrated Circuits Conference (CICC)},
         pages = {305-308},
         month = {9},
          year = {2005},
}

@inproceedings{id96,
         title = {LSI 配線における容量性, 誘導性クロストークノイズの定量的将来予測},
        author = {小笠原 泰弘 and 橋本 昌宜 and 尾上 孝雄},
     booktitle = {第19回 回路とシステム(軽井沢)ワークショップ},
         pages = {5-10},
         month = {4},
          year = {2006},
}

@inproceedings{id90,
         title = {電源ノイズによる遅延変動の測定とフルチップシミュレーションによる遅延変動の再現},
        author = {小笠原泰弘 and 榎並孝司 and 橋本昌宜 and 佐藤高史、尾上孝雄},
     booktitle = {電子情報通信学会 集積回路研究会,},
        number = {ICD2006-174},
         month = {1},
          year = {2007},
}

@inproceedings{id89,
         title = {90nm グローバル配線における誘導性クロストークノイズによる遅延変動の実測},
        author = {小笠原泰弘 and 橋本昌宜 and 尾上孝雄},
     booktitle = {電子情報通信学会 集積回路研究会},
        number = {ICD2006-173},
         month = {1},
          year = {2007},
}

@inproceedings{id92,
         title = {ナノメートル世代のVLSIタイミング設計技術の研究},
        author = {小笠原泰弘 and 新開健一 and 榎並孝司 and 阿部慎也 and 二宮進有 and 橋本昌宜},
     booktitle = {第10回システムLSIワークショップ},
         pages = {195-198},
         month = {11},
          year = {2006},
}

@inproceedings{id106,
         title = {誘導性・容量性クロストークノイズによる遅延変動の測定と評価},
        author = {小笠原泰弘 and 橋本昌宜 and 尾上孝雄},
     booktitle = {電子情報通信学会 集積回路研究会},
        number = {ICD2005-74},
         month = {8},
          year = {2005},
}