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この検索内の頻出タグ: cells:1 circuit:1 composed:1 dynamic:1 in-site:1 integrity:1 measurement:1 noise:1 power:1 soc:1 standard:1 suitable:1 supply:1 verification:1

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国際会議
[1] Y. Ogasahara, M. Hashimoto, and T. Onoye, "Dynamic Supply Noise Measurement Circuit Composed of Standard Cells Suitable for In-Site SoC Power Integrity Verification," Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC), pages 107--108, January 2008. [97.pdf]