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国際会議

[1] Y. Ogasahara, M. Hashimoto, and T. Onoye, "Dynamic Supply Noise Measurement Circuit Composed of Standard Cells Suitable for In-Site SoC Power Integrity Verification," Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC), pages 107--108, January 2008. [97.pdf]

[2] M. Hashimoto, K. Fujimori, and H. Onodera, "Automatic Generation of Standard Cell Library in VDSM Technologies," In Proceedings of International Symposium on Quality Electronic Design (ISQED), pages 36-41, March 2004. [53.PDF]