- 国際会議
- [1] Y. Ogasahara, M. Hashimoto, and T. Onoye, "Dynamic Supply Noise Measurement Circuit Composed of Standard Cells Suitable for In-Site SoC Power Integrity Verification," Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC), pages 107--108, January 2008. [97.pdf]
- 著書
- [1] R. Nair, M. Hashimoto, and N. Srivastava, "IC Power Integrity and Optimal Power Delivery," Book chapter, Power Integrity Analysis and Management for Integrated Circuits, Prentice Hall PTR, May 2010.