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@article{id398,
         title = {Exploring Well-Configurations for Minimizing Single Event Latchup},
        author = {T. Uemura and T. Kato and R. Tanabe and H. Iwata and J. Ariyoshi and H. Matsuyama and M. Hashimoto},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {61},
        number = {6},
         pages = {3282--3289},
         month = {12},
          year = {2014},
}

@article{id368,
         title = {Mitigating Multi-Bit-Upset with Well-Slits in 28 {nm} Multi-Bit-Latch},
        author = {T. Uemura and T. Kato and H. Matsuyama and M. Hashimoto},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {60},
        number = {6},
         pages = {4362--4367},
         month = {12},
          year = {2013},
}

@article{id369,
         title = {Soft-Error in {SRAM} at Ultra-Low Voltage  and Impact of Secondary Proton  in Terrestrial Environment},
        author = {T. Uemura and T. Kato and H. Matsuyama and M. Hashimoto},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {60},
        number = {6},
         pages = {4232--4237},
         month = {12},
          year = {2013},
}

@article{id332,
         title = {Angular Dependency of Neutron Induced Multiple Cell Upsets in {65-nm} {10T} Subthreshold {SRAM}},
        author = {R. Harada and S. Abe and H. Fuketa and T. Uemura and M. Hashimoto and Y. Watanabe},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {59},
        number = {6},
         pages = {2791--2795},
         month = {12},
          year = {2012},
}

@article{id400,
         title = {Impact of Package on Neutron Induced Single Event Upset in 20 {nm} {SRAM}},
        author = {T. Uemura and T. Kato and S. Okano and H. Matsuyama and M. Hashimoto},
       journal = {Proceedings of International Symposium on Reliability Physics (IRPS)},
         month = {4},
          year = {2015},
}

@article{id401,
         title = {Investigation of Single Event Upset and Total Ionizing Dose in {FeRAM} for Medical Electronic Tag},
        author = {T. Uemura and M. Hashimoto},
       journal = {Proceedings of International Symposium on Reliability Physics (IRPS)},
         month = {4},
          year = {2015},
}

@article{id402,
         title = {Soft Error Immune Latch Design for 20 {nm} bulk {CMOS}},
        author = {T. Uemura and S. Okano and T. Kato and H. Matsuyama and M. Hashimoto},
       journal = {Proceedings of International Reliability Physics Symposium (IRPS)},
         month = {4},
          year = {2015},
}

@article{id378,
         title = {Optimizing Well-Configuration for Minimizing Single Event Latchup},
        author = {T. Uemura and T. Kato and R. Tanabe and H. Iwata and J. Ariyoshi and H. Matsuyama and M. Hashimoto},
       journal = {IEEE Nuclear and Space Radiation Effects Conference (NSREC)},
         month = {7},
          year = {2014},
}

@article{id377,
         title = {Preventing Single Event Latchup with Deep P-well on P-substrate},
        author = {T. Uemura and T. Kato and R. Tanabe and H. Iwata and H. Matsuyama and M. Hashimoto and K. Takahisa and M. Fukuda and K. Hatanaka},
       journal = {Proceedings of International Reliability Physics Symposium (IRPS)},
         month = {6},
          year = {2014},
}

@article{id346,
         title = {Scaling Trend of {SRAM} and {FF} of Soft-Error Rate and Their Contribution to Processor reliability on Bulk {CMOS} Technology},
        author = {T. Uemura and T. Kato and H. Matsuyama and M. Hashimoto},
       journal = {IEEE Nuclear and Space Radiation Effects Conference (NSREC)},
         month = {7},
          year = {2013},
}

@article{id347,
         title = {Soft-Error in {SRAM} at Ultra Low Voltage and Impact of Secondary Proton in Terrestrial Environment},
        author = {T. Uemura and T. Kato and H. Matsuyama and M. Hashimoto},
       journal = {IEEE Nuclear and Space Radiation Effects Conference (NSREC)},
         month = {7},
          year = {2013},
}

@article{id348,
         title = {Mitigating Multi-Cell-Upset with Well-Slits in 28nm Multi-Bit-Latch},
        author = {T. Uemura and T. Kato and H. Matsuyama and M. Hashimoto},
       journal = {IEEE Nuclear and Space Radiation Effects Conference (NSREC)},
         month = {7},
          year = {2013},
}

@article{id316,
         title = {Angular Dependency of Neutron Induced Multiple Cell Upsets in {65-nm} {10T} Subthreshold {SRAM}},
        author = {R. Harada and S. Abe and H. Fuketa and T. Uemura and M. Hashimoto and Y. Watanabe},
       journal = {IEEE Nuclear and Space Radiation Effects Conference (NSREC)},
         month = {7},
          year = {2012},
}

@inproceedings{id42,
         title = {Estimation of Maximum Oscillation Frequency for {CMOS} {LCVCOs}},
        author = {S. Uemura and T. Miyazaki and M. Hashimoto and H. Onodera},
     booktitle = {Proceedings of IEEJ International Analog VLSI Workshop},
         month = {10},
          year = {2005},
}