論文誌
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K. Takeuchi, K. Sakamoto, Y. Tsuchiya, T. Kato, R. Nakamura, A. Takeyama, T. Makino, T. Ohshima, M. Hashimoto, H. Shindo
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Cross-Section Prediction Method for Proton Direct Ionization Induced Single Event Upset
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IEEE Transactions on Nuclear Science
| 72(8)
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2735 - 2742
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2025年8月
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| pdf
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論文誌
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S. Abe, M. Hashimoto, W. Liao, T. Kato, H. Asai, K. Shimbo, H. Matsuyama, T. Sato, K. Kobayashi, Y. Watanabe
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A Terrestrial SER Estimation Methodology Based on Simulation Coupled with One-Time Neutron Irradiation Testing
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IEEE Transactions on Nuclear Science
| 70(8)
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1652 -- 1657
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2023年8月
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| pdf
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論文誌
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T. Kato, M. Tampo, S. Takeshita, H. Tanaka, H. Matsuyama, M. Hashimoto, Y. Miyake
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Muon-Induced Single-Event Upsets in 20-nm SRAMs: Comparative Characterization with Neutrons and Alpha Particles
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IEEE Transactions on Nuclear Science
| 68(7)
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1436-1444
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2021年7月
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| pdf
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論文誌
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T. Kato, M. Hashimoto, H. Matsuyama
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Angular Sensitivity of Neutron-Induced Single-Event Upsets in 12-nm FinFET SRAMs with Comparison to 20-nm Planar SRAMs
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IEEE Transactions on Nuclear Science
| 67(7)
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1485 -- 1493
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2020年7月
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| pdf
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論文誌
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T. Uemura, T. Kato, R. Tanabe, H. Iwata, J. Ariyoshi, H. Matsuyama, M. Hashimoto
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Exploring Well-Configurations for Minimizing Single Event Latchup
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IEEE Transactions on Nuclear Science
| 61(6)
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3282--3289
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2014年12月
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| 211.pdf
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論文誌
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T. Uemura, T. Kato, H. Matsuyama, M. Hashimoto
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Mitigating Multi-Bit-Upset with Well-Slits in 28 nm Multi-Bit-Latch
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IEEE Transactions on Nuclear Science
| 60(6)
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4362--4367
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2013年12月
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| 197.pdf
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論文誌
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T. Uemura, T. Kato, H. Matsuyama, M. Hashimoto
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Soft-Error in SRAM at Ultra-Low Voltage and Impact of Secondary Proton in Terrestrial Environment
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IEEE Transactions on Nuclear Science
| 60(6)
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4232--4237
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2013年12月
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| 198.pdf
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国際会議
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K. Takeuchi, K. Sakamoto, Y. Tsuchiya, T. Kato, R. Nakamura, A. Takeyama, T. Makino, T. Ohshima, M. Hashimoto, H. Shindo
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Cross-Section Prediction Method for Proton Direct Ionization Induced Single Event Upset
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Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
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2024年9月
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国際会議
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K. Takeuchi, T. Kato, M. Hashimoto
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An SEU Cross Section Model Reproducing LET and Voltage Dependence in Bulk Planar and FinFET SRAMs
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Proceedings of International Symposium on Reliability Physics (IRPS)
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2024年4月
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| pdf
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国際会議
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S. Abe, M. Hashimoto, W. Liao, T. Kato, H. Asai, K. Shimbo, H. Matsuyama, T. Sato, K. Kobayashi, Y. Watanabe
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A Terrestrial SER Estimation Methodology with Simulation and Single-Source Irradiation Applicable to Diverse Neutron Sources
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Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
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2022年10月
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国際会議
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T. Kato, M. Tampo, S. Takeshita, Y. Miyake, H Tanaka, M. Hashimoto
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Muon-Induced Single-Event Upsets in 20-nm SRAMs: Comparative Characterization with Neutrons and Alpha-Particles
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IEEE Nuclear and Space Radiation Effects Conference (NSREC)
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2020年11月
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国際会議
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T. Uemura, T. Kato, S. Okano, H. Matsuyama, M. Hashimoto
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Impact of Package on Neutron Induced Single Event Upset in 20 nm SRAM
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Proceedings of International Symposium on Reliability Physics (IRPS)
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2015年4月
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| 215.pdf
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国際会議
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T. Uemura, S. Okano, T. Kato, H. Matsuyama, M. Hashimoto
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Soft Error Immune Latch Design for 20 nm Bulk CMOS
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Proceedings of International Reliability Physics Symposium (IRPS)
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2015年4月
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| 217.pdf
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国際会議
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T. Uemura, T. Kato, R. Tanabe, H. Iwata, J. Ariyoshi, H. Matsuyama, M. Hashimoto
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Optimizing Well-Configuration for Minimizing Single Event Latchup
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IEEE Nuclear and Space Radiation Effects Conference (NSREC)
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2014年7月
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国際会議
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T. Uemura, T. Kato, R. Tanabe, H. Iwata, H. Matsuyama, M. Hashimoto, K. Takahisa, M. Fukuda, K. Hatanaka
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Preventing Single Event Latchup with Deep P-Well on P-Substrate
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Proceedings of International Reliability Physics Symposium (IRPS)
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2014年6月
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| 203.pdf
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国際会議
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T. Uemura, T. Kato, H. Matsuyama, M. Hashimoto
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Scaling Trend of SRAM and FF of Soft-Error Rate and Their Contribution to Processor Reliability on Bulk CMOS Technology
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IEEE Nuclear and Space Radiation Effects Conference (NSREC)
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2013年7月
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国際会議
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T. Uemura, T. Kato, H. Matsuyama, M. Hashimoto
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Soft-Error in SRAM at Ultra Low Voltage and Impact of Secondary Proton in Terrestrial Environment
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IEEE Nuclear and Space Radiation Effects Conference (NSREC)
|
|
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2013年7月
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国際会議
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T. Uemura, T. Kato, H. Matsuyama, M. Hashimoto
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Mitigating Multi-Cell-Upset with Well-Slits in 28nm Multi-Bit-Latch
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IEEE Nuclear and Space Radiation Effects Conference (NSREC)
|
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2013年7月
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