この検索内の頻出タグ: srams^:8 28-nm^:4 seu^:4 simulation^:4 12-^:3 12-nm^:3 finfet^:3 muon-induced^:3 analysis^:2 cell^:2 coupled^:2 cross^:2 different^:2 estimated^:2 irradiation^:2 neutron^:2 one-time^:2 planar^:2 sections^:2 ser^:2 terrestrial^:2 types^:2 validating^:2 14.8^:1 22-nm^:1 28-^:1 55-nm^:1 6.0^:1 65-nm^:1 8.0^:1

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論文誌

[1] K. Takami, Y. Gomi, R. Yasuda, S. Abe, M. Itoh, H. Kanda, M. Fukuda, and M. Hashimoto, "Validating Terrestrial SER in 12-, 28- and 65-nm SRAMs Estimated by Simulation Coupled with One-Time Neutron Irradiation," IEEE Transactions on Nuclear Science, 採録済.

[2] Y. Gomi, K. Takami, R. Mizuno, M. Niikura, R. Yasuda, Y. Deng, S. Kawase, Y. Watanabe, S. Abe, W. Liao, M. Tampo, S. Takeshita, K. Shimomura, Y. Miyake, and M. Hashimoto, "Muon-Induced SEU Analysis and Simulation for Different Cell Types in 12-nm FinFET SRAMs, and 28-nm Planar SRAMs and Register Files," IEEE Transactions on Nuclear Science, 採録済.

[3] Y. Li, M. Yoshida, Y. Gomi, Y. Deng, Y. Watanabe, S. Adachi, M. Itoh, G. Zhang, C. He, and M. Hashimoto, "Experimental Study of Proton-Induced Radiation Effects on DDR5 Modules," IEEE Transactions on Nuclear Science, volume 72, number 6, pages 1907-1918, June 2025. [pdf]

国際会議

[1] Y. Gomi, K. Takami, R. Yasuda, H. Kanda, M. Fukuda, and M. Hashimoto, "Quasi Event-Wise Measurement of Neutron-Induced Multiple-Cell Upsets in 22-nm and 55-nm SRAMs," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), 採録済.

[2] M. Hashimoto, R. Yasuda, K. Takami, Y. Gomi, and K. Takeuchi, "ML-assisted SRAM Soft Error Rate Characterization: Opportunities and Challenges," Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC), 379 - 384, January 2025. [pdf]

[3] Y. Gomi, K. Takami, R. Mizuno, M. Niikura, R. Yasuda, Y. Deng, S. Kawase, Y. Watanabe, S. Abe, W. Liao, M. Tampo, S. Takeshita, K. Shimomura, Y. Miyake, and M. Hashimoto, "Muon-Induced SEU Analysis and Simulation for Different Cell Types in 12-nm FinFET SRAMs," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), September 2024.

[4] K. Takami, Y. Gomi, R. Yasuda, S. Abe, M. Itoh, H. Kanda, M. Fukuda, and M. Hashimoto, "Validating Terrestrial SER in 12- and 28-nm SRAMs Estimated by Simulation Coupled with One-Time Neutron Irradiation," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), September 2024.

[5] Y. Gomi, K. Takami, R. Mizuno, M. Niikura, Y. Deng, S. Kawase, Y. Watanabe, S. Abe, W. Liao, M. Tampo, I. Umegaki, S. Takeshita, K. Shimomura, Y. Miyake, and M. Hashimoto, "Muon-Induced SEU Cross Sections of 12-nm FinFET and 28-nm Planar SRAMs," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), September 2023.

[6] K. Takami, Y. Gomi, S. Abe, W. Liao, S. Manabe, T. Matsumoto, and M. Hashimoto, "Characterizing SEU Cross Sections of 12- and 28-nm SRAMs for 6.0, 8.0, and 14.8 MeV Neutrons," Proceedings of International Reliability Physics Symposium (IRPS), March 2023. [pdf]