論文誌
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Y. Gomi, A. Sato, W. Madany, K. Okada, S. Adachi, M. Itoh, M.Hashimoto
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A 55-nm SRAM Chip Scanning Errors Every 125 ns for Event-Wise Soft Error Measurement
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IEEE Solid-State Circuits Letters
| 8
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245-248
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2025年9月
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| pdf
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論文誌
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K. Takami, Y. Gomi, R. Yasuda, S. Abe, M. Itoh, H. Kanda, M. Fukuda, M. Hashimoto
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Validating Terrestrial SER in 12-, 28- and 65-nm SRAMs Estimated by Simulation Coupled with One-Time Neutron Irradiation
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IEEE Transactions on Nuclear Science
| 72(8)
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2622-2628
|
2025年8月
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| pdf
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論文誌
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Y. Gomi, K. Takami, R. Mizuno, M. Niikura, R. Yasuda, Y. Deng, S. Kawase, Y. Watanabe, S. Abe, W. Liao, M. Tampo, S. Takeshita, K. Shimomura, Y. Miyake, M. Hashimoto
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Muon-Induced SEU Analysis and Simulation for Different Cell Types in 12-nm FinFET SRAMs, and 28-nm Planar SRAMs and Register Files
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IEEE Transactions on Nuclear Science
| 72(8)
|
2751 - 2762
|
2025年8月
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| pdf
|
論文誌
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Y. Li, M. Yoshida, Y. Gomi, Y. Deng, Y. Watanabe, S. Adachi, M. Itoh, G. Zhang, C. He, M. Hashimoto
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Experimental Study of Proton-Induced Radiation Effects on DDR5 Modules
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IEEE Transactions on Nuclear Science
| 72(6)
|
1907-1918
|
2025年6月
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| pdf
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国際会議
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Y. Gomi, K. Takami, R. Yasuda, H. Kanda, M. Fukuda, M. Hashimoto
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Quasi Event-Wise Measurement of Neutron-Induced Multiple-Cell Upsets in 22-nm and 55-nm SRAMs
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Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
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2025年9月
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国際会議
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M. Hashimoto, R. Yasuda, K. Takami, Y. Gomi, K. Takeuchi
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ML-assisted SRAM Soft Error Rate Characterization: Opportunities and Challenges
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Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC)
|
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379 - 384
|
2025年1月
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| pdf
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国際会議
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Y. Gomi, K. Takami, R. Mizuno, M. Niikura, R. Yasuda, Y. Deng, S. Kawase, Y. Watanabe, S. Abe, W. Liao, M. Tampo, S. Takeshita, K. Shimomura, Y. Miyake, M. Hashimoto
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Muon-Induced SEU Analysis and Simulation for Different Cell Types in 12-nm FinFET SRAMs
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Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
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2024年9月
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国際会議
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K. Takami, Y. Gomi, R. Yasuda, S. Abe, M. Itoh, H. Kanda, M. Fukuda, M. Hashimoto
|
Validating Terrestrial SER in 12- and 28-nm SRAMs Estimated by Simulation Coupled with One-Time Neutron Irradiation
|
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
|
|
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2024年9月
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国際会議
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Y. Gomi, K. Takami, R. Mizuno, M. Niikura, Y. Deng, S. Kawase, Y. Watanabe, S. Abe, W. Liao, M. Tampo, I. Umegaki, S. Takeshita, K. Shimomura, Y. Miyake, M. Hashimoto
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Muon-Induced SEU Cross Sections of 12-nm FinFET and 28-nm Planar SRAMs
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Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
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2023年9月
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| pdf
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国際会議
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K. Takami, Y. Gomi, S. Abe, W. Liao, S. Manabe, T. Matsumoto, M. Hashimoto
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Characterizing SEU Cross Sections of 12- and 28-nm SRAMs for 6.0, 8.0, and 14.8 MeV Neutrons
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Proceedings of International Reliability Physics Symposium (IRPS)
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2023年3月
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| pdf
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