論文誌
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S. Hirokawa, R. Harada, M. Hashimoto, T. Onoye
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Characterizing Alpha- and Neutron-Induced SEU and MCU on SOTB and Bulk 0.4-V SRAMs
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IEEE Transactions on Nuclear Science
| 62(2)
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420--427
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2015年4月
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| 219.pdf
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国際会議
|
M. Hashimoto, W. Liao, S. Hirokawa
|
Soft Error Rate Estimation with TCAD and Machine Learning (Invited)
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Proceedings of International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
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|
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2017年9月
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| pdf
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国際会議
|
W. Liao, S. Hirokawa, R. Harada, M. Hashimoto
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Contributions of SRAM, FF and Combinational Circuit to Chip-Level Neutron-Induced Soft Error Rate -- Bulk vs. FD-SOI at 0.5 and 1.0V --
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Proceedings of International NEWCAS Conference
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33-37
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2017年6月
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| pdf
|
国際会議
|
S. Hirokawa, R. Harada, K. Sakuta, Y. Watanabe, M. Hashimoto
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Multiple Sensitive Volume Based Soft Error Rate Estimation with Machine Learning
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Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
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|
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2016年9月
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| pdf
|
国際会議
|
S. Hirokawa, R. Harada, M. Hashimoto, K. Sakuta, Y. Watanabe
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Neutron-Induced SEU and MCU Rate Characterization and Analysis of SOTB and Bulk SRAMs at 0.3V Operation
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IEEE Nuclear and Space Radiation Effects Conference (NSREC)
|
|
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2015年7月
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|
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国際会議
|
R. Harada, S. Hirokawa, M. Hashimoto
|
Measurement of Alpha- and Neutron-Induced SEU and MCU on SOTB and Bulk 0.4 V SRAMs
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IEEE Nuclear and Space Radiation Effects Conference (NSREC)
|
|
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2014年7月
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