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論文誌

[1] R. Mizuno, M. Niikura, T.Y. Saito, T. Matsuzaki, S. Abe, H. Fukuda, M. Hashimoto, A. Hillier, K. Ishida, N. Kawamura, S. Kawase, T. Kawata, K. Kitafuji, F. Minato, M. Oishi, A. Sato, K. Shimomura, P. Strasser, S. Takeshita, D. Tomono, and Y. Watanabe, "Measurement of Production Branching Ratio After Muon Nuclear Capture Reaction of Al and Si Isotopes," Physical Review C, volume 112, number 26, page 054305, November 2025. [pdf]

[2] M. Hashimoto, X. Bai, N. Banno, M. Tada, T. Sakamoto, J. Yu, R. Doi, H. Onodera, T. Imagawa, H. Ochi, K. Wakabayashi, Y. Mitsuyama, and T. Sugibayashi, "Via-Switch FPGA with Transistor-Free Programmability Enabling Energy-Efficient Near-Memory Parallel Computation," Japanese Journal of Applied Physics, volume 61, number SM0804, October 2022. [pdf]

[3] N. Banno, K. Okamoto, N. Iguchi, H. Ochi, H. Onodera, M. Hashimoto, T. Sugibayashi, T. Sakamoto, and M. Tada, "Low-Power Crossbar Switch with Two-Varistors Selected Complementary Atom Switch (2V-1CAS; Via-Switch) for Nonvolatile FPGA," IEEE Transactions on Electron Devices, volume 66, number 8, pages 3331--3336, August 2019. [pdf]

[4] T. Okumura, A. Kurokawa, H. Masuda, T. Kanamoto, M. Hashimoto, H. Takafuji, H. Nakashima, N. Ono, T. Sakata, and T. Sato, "Improvement in Computational Accuracy of Output Transition Time Variation Considering Threshold Voltage Variations," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume 92-A, number 4, pages 990--997, April 2009. [119.pdf]

[5] H. Kobayashi, N. Ono, T. Sato, J. Iwai, H. Nakashima, T. Okumura, and M. Hashimoto, "Proposal of Metrics for SSTA Accuracy Evaluation," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E90-A, number 4, pages 808--814, April 2007. [81.pdf]

[6] T. Sato, J. Ichimiya, N. Ono, and M. Hashimoto, "On-Chip Thermal Gradient Analysis Considering Interdependence between Leakage Power and Temperature," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E89-A, number 12, pages 3491-3499, December 2006. [4.pdf]

[7] T. Sato, J. Ichimiya, N. Ono, K. Hachiya, and M. Hashimoto, "On-Chip Thermal Gradient Analysis and Temperature Flattening for SoC Design," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E88-A, number 12, pages 3382-3389, December 2005. [9.pdf]

国際会議

[1] R. Mizuno, M. Niikura, T.Y. Saito, T. Matsuzaki, S. Abe, H. Fukuda, M. Hashimoto, A. D. Hillier, K. Ishida, N. Kawamura, S. Kawase, T. Kawata, K. Kitafuji, F. Minato, M. Oishi, A. Sato, K. Shimomura, P. Strasser, S. Takeshita, D. Tomono, and Y. Watanabe, "Study of Excited States Populated by Muon Nuclear Capture Based on the Production Branching Ratio Measurement," The 8th international workshop on Compound-Nuclear Reactions and Related Topics (CNR*26), 採録済.

[2] R. Mizuno, M. Niikura, T.Y. Saito, T. Matsuzaki, S. Abe, H. Fukuda, M. Hashimoto, A. D. Hillier, K. Ishida, N. Kawamura, S. Kawase, T. Kawata, K. Kitafuji, F. Minato, M. Oishi, A. Sato, K. Shimomura, P. Strasser, S. Takeshita, D. Tomono, and Y. Watanabe, "Study of Excited States Populated by Muon Nuclear Capture Based on the Production Branching Ratio Measurement," The 5th Conference on Advances in Radioactive Isotope Science (ARIS2026), February 2026.

[3] R. Mizuno, M. Niikura, T. Y. Saito, T. Matsuzaki, S. Abe, H. Fukuda, M. Hashimoto, K. Ishida, N. Kawamura, S. Kawase, M. Oishi, P. Strasser, A. Sato, K. Shimomura, S. Takeshita, I. Umegaki, A. Hillier, T. Kawata, K. Kitafuji, Y. Yamaguchi, D. Tomono, and F. Minato, "In-Beam Activation Measurement of Muon Nuclear Capture Reaction on Si Isotopes," The workshop on frontier nuclear studies with gamma-ray spectrometer arrays (gamma24), March 2024.

[4] R. Mizuno, M. Niikura, T. Y. Saito, T. Matsuzaki, S. Abe, H. Fukuda, M. Hashimoto, K. Ishida, N. Kawamura, S. Kawase, M. Oishi, P. Strasser, A. Sato, K. Shimomura, S. Takeshita, I. Umegaki, A. Hillier, T. Kawata, K. Kitafuji, Y. Yamaguchi, D. Tomono, and F. Minato, "Muon Nuclear Capture Reaction on 28,29,30si," 2023 Fall meeting of APS DNP and JPS, November 2023.

[5] M. Niikura, R. Mizuno, S. Manabe, T. Y. Saito, T. Matsuzaki, S. Abe, H. Fukuda, M. Hashimoto, K. Ishida, A. Hillier, N. Kawamura, Y. Kawashima, S. Kawase, T. Kawata, K. Kitafuji, F. Minato, M. Oishi, P. Strasser, A. Sato, K. Shimomura, S. Takeshita, M. Tampo, D. Tomono, I. Umegaki, Y. Yamaguchi, and Y. Watanabe, "Nuclear Physics for Muon-Induced Soft Error," Workshop for Computational Technique for Negative Muon Spectroscopy and Elemental Analysis, August 2023.

[6] M. Hashimoto, X. Bai, N. Banno, M. Tada, T. Sakamoto, J. Yu, R. Doi, Y. Araki, H. Onodera, T. Imagawa, H. Ochi, K. Wakabayashi, Y. Mitsuyama, and T. Sugibayashi, "Via-Switch FPGA: 65nm CMOS Implementation and Architecture Extension for AI Applications," Technical Digest of International Solid-State Circuits Conference (ISSCC), pages 502--503, February 2020. [pdf]

[7] N. Banno, M. Tada, K. Okamoto, N. Iguchi, T. Sakamoto, H. Hada, H. Ochi, H. Onodera, M. Hashimoto, and T. Sugibayashi, "50x20 Crossbar Switch Block (CSB) with Two-Varistors (a-Si/SiN/a-Si) Selected Complementary Atom Switch for a Highly-Dense Reconfigurable Logic," Technical Digest of IEEE International Electron Devices Meeting (IEDM), December 2016. [231.PDF]

[8] H. Hihara, A. Iwasaki, N. Tamagawa, M. Kuribayashi, M. Hashimoto, Y. Mitsuyama, H. Ochi, H. Onodera, H. Kanbara, K. Wakabayashi, and T. Sugibayashi, "Novel Processor Architecture for Onboard Infrared Sensors (Invited)," Proceedings of SPIE Infrared Remote Sensing and Instrumentation XXIV, volume 9973, August 2016.

[9] N. Banno, M.Tada, K. Okamoto, N. Iguchi, T. Sakamoto, M. Miyamura, Y. Tsuji, H. Hada, H. Ochi, H. Onodera, M. Hashimoto, and T. Sugibayashi, "A Novel Two-Varistors (a-Si/SiN/a-Si) Selected Complementary Atom Switch (2V-1CAS) for Nonvolatile Crossbar Switch with Multiple Fan-Outs," Technical Digest of IEEE International Electron Devices Meeting (IEDM), pages 32--35, December 2015. [225.PDF]

[10] T. Sato, N. Ono, J. Ichimiya, K. Hachiya, and M. Hashimoto, "On-Chip Thermal Gradient Analysis and Temperature Flattening for SoC Design," In Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC), pages 1074-1077, January 2005. [34.pdf]

国内会議(査読付き)

[1] 小林宏行, 小野信任, 佐藤高史, 岩井二郎, 橋本昌宜, "統計的STAの有効性の検証手法," 第19回 回路とシステム(軽井沢)ワークショップ, pages 553-558, 2006年4月. [74.pdf]

[2] 佐藤高史, 市宮淳次, 小野信任, 蜂屋孝太郎, 橋本昌宜, "フロアプランにおけるオンチップ熱ばらつきの解析と対策," 情報処理学会DAシンポジウム, pages 133-138, 2004年7月.

研究会・全国大会等

[1] R. Mizuno, M. Niikura, T. Y. Saito, T. Matsuzaki, S. Abe, H. Fukuda, M. Hashimoto, K. Ishida, N. Kawamura, S. Kawase, M. Oishi, P. Strasser, A. Sato, K. Shimomura, S. Takeshita, I. Umegaki, A. Hillier, T. Kawata, K. Kitafuji, and D. Tomono, "ミューオン原子核捕獲反応による生成核分岐比の測定," 第12回停止・低速RIビームを用いた核分光研究会 (12th SSRI), September 2023.