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論文誌

[1] K. Takami, Y. Gomi, R. Yasuda, S. Abe, M. Itoh, H. Kanda, M. Fukuda, and M. Hashimoto, "Validating Terrestrial SER in 12-, 28- and 65-nm SRAMs Estimated by Simulation Coupled with One-Time Neutron Irradiation," IEEE Transactions on Nuclear Science, volume 72, number 8, pages 2622-2628, August 2025. [pdf]

[2] J. Chen, H. Kando, T. Kanamoto, C. Zhuo, and M. Hashimoto, "A Multi-Core Chip Load Model for PDN Analysis Considering Voltage-Current-Timing Interdependency and Operation Mode Transitions," IEEE Transactions on Components, Packaging and Manufacturing Technology, volume 9, number 9, pages 1669--1679, September 2019. [pdf]

国際会議

[1] Y. Gomi, K. Takami, R. Yasuda, H. Kanda, M. Fukuda, and M. Hashimoto, "Quasi Event-Wise Measurement of Neutron-Induced Multiple-Cell Upsets in 22-nm and 55-nm SRAMs," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), 採録済.

[2] K. Takami, Y. Gomi, R. Yasuda, S. Abe, M. Itoh, H. Kanda, M. Fukuda, and M. Hashimoto, "Validating Terrestrial SER in 12- and 28-nm SRAMs Estimated by Simulation Coupled with One-Time Neutron Irradiation," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), September 2024.

[3] J. Chen, T. Kanamoto, H. Kando, and M. Hashimoto, "An On-Chip Load Model for Off-Chip PDN Analysis Considering Interdependency between Supply Voltage, Current Profile and Clock Latency," Proceedings of IEEE Workshop on Signal and Power Integrity (SPI), May 2018. [pdf]