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6 件の該当がありました. : このページのURL : HTML


著者名 (author) 表題 (title) 論文誌/会議名 巻号 ページ範囲 (pages) 出版年月 JCR/採択率 File
論文誌
T. Tanaka, W. Liao, M. Hashimoto, Y. Mitsuyama
Impact of Neutron-Induced SEU in FPGA CRAM on Image-Based Lane Tracking for Autonomous Driving: from Bit Upset to SEFI and Erroneous Behavior
IEEE Transactions on Nuclear Science
69(1)
35--42
2022年1月

pdf
論文誌
T. Kato, M. Tampo, S. Takeshita, H. Tanaka, H. Matsuyama, M. Hashimoto, Y. Miyake
Muon-Induced Single-Event Upsets in 20-nm SRAMs: Comparative Characterization with Neutrons and Alpha Particles
IEEE Transactions on Nuclear Science
68(7)
1436-1444
2021年7月

pdf
国際会議
T. Tanaka, M. Hashimoto, Y. Takeuchi
Linear Programming Based Reliable Software Performance Model Construction with Noisy CPU Performance Counter Values
Proceedings of Workshop on Synthesis and System Integration of Mixed Technologies (SASIMI)


2021年3月


国際会議
T. Kato, M. Tampo, S. Takeshita, Y. Miyake, H Tanaka, M. Hashimoto
Muon-Induced Single-Event Upsets in 20-nm SRAMs: Comparative Characterization with Neutrons and Alpha-Particles
IEEE Nuclear and Space Radiation Effects Conference (NSREC)


2020年11月


国際会議
Y. Akihara, T. Hirose, Y. Tanaka, N. Kuroki, M. Numa, M. Hashimoto
A Wireless Power Transfer System for Small-Sized Sensor Applications
Proceedings of International Conference on Solid State Devices and Materials (SSDM)

154--155
2015年9月


著書
T. Sato, M. Hashimoto, S. Tanakamaru, K. Takeuchi, Y. Sato, S. Kajihara, M. Yoshimoto, J. Jung, Y. Kimi, H. Kawaguchi, H. Shimada, J. Yao
Time-Dependent Degradation in Device Characteristics and Countermeasures by Design
Book chapter, VLSI Design and Test for Systems Dependability, Springer


2018年8月