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論文誌

[1] R. Mizuno, M. Niikura, T.Y. Saito, T. Matsuzaki, S. Abe, H. Fukuda, M. Hashimoto, A. Hillier, K. Ishida, N. Kawamura, S. Kawase, T. Kawata, K. Kitafuji, F. Minato, M. Oishi, A. Sato, K. Shimomura, P. Strasser, S. Takeshita, D. Tomono, and Y. Watanabe, "Measurement of Production Branching Ratio After Muon Nuclear Capture Reaction of Al and Si Isotopes," Physical Review C, volume 112, number 26, page 054305, November 2025. [pdf]

[2] Y. Gomi, K. Takami, R. Mizuno, M. Niikura, R. Yasuda, Y. Deng, S. Kawase, Y. Watanabe, S. Abe, W. Liao, M. Tampo, S. Takeshita, K. Shimomura, Y. Miyake, and M. Hashimoto, "Muon-Induced SEU Analysis and Simulation for Different Cell Types in 12-nm FinFET SRAMs, and 28-nm Planar SRAMs and Register Files," IEEE Transactions on Nuclear Science, volume 72, number 8, 2751 - 2762, August 2025. [pdf]

[3] T. Mahara, S. Manabe, Y. Watanabe, W. Liao, M. Hashimoto, T. Y. Saito, M. Niikura, K. Ninomiya, D. Tomono, and A. Sato, "Irradiation Test of 65 nm Bulk SRAMs with DC Muon Beam at RCNP MuSIC Facility," IEEE Transactions on Nuclear Science, volume 67, number 7, 1555 -- 1559, July 2020. [pdf]

国際会議

[1] R. Mizuno, M. Niikura, T.Y. Saito, T. Matsuzaki, S. Abe, H. Fukuda, M. Hashimoto, A. D. Hillier, K. Ishida, N. Kawamura, S. Kawase, T. Kawata, K. Kitafuji, F. Minato, M. Oishi, A. Sato, K. Shimomura, P. Strasser, S. Takeshita, D. Tomono, and Y. Watanabe, "Study of Excited States Populated by Muon Nuclear Capture Based on the Production Branching Ratio Measurement," The 8th international workshop on Compound-Nuclear Reactions and Related Topics (CNR*26), 採録済.

[2] R. Mizuno, M. Niikura, T.Y. Saito, T. Matsuzaki, S. Abe, H. Fukuda, M. Hashimoto, A. D. Hillier, K. Ishida, N. Kawamura, S. Kawase, T. Kawata, K. Kitafuji, F. Minato, M. Oishi, A. Sato, K. Shimomura, P. Strasser, S. Takeshita, D. Tomono, and Y. Watanabe, "Study of Excited States Populated by Muon Nuclear Capture Based on the Production Branching Ratio Measurement," The 5th Conference on Advances in Radioactive Isotope Science (ARIS2026), February 2026.

[3] Y. Gomi, K. Takami, R. Mizuno, M. Niikura, R. Yasuda, Y. Deng, S. Kawase, Y. Watanabe, S. Abe, W. Liao, M. Tampo, S. Takeshita, K. Shimomura, Y. Miyake, and M. Hashimoto, "Muon-Induced SEU Analysis and Simulation for Different Cell Types in 12-nm FinFET SRAMs," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), September 2024.

[4] R. Mizuno, M. Niikura, T. Y. Saito, T. Matsuzaki, S. Abe, H. Fukuda, M. Hashimoto, K. Ishida, N. Kawamura, S. Kawase, M. Oishi, P. Strasser, A. Sato, K. Shimomura, S. Takeshita, I. Umegaki, A. Hillier, T. Kawata, K. Kitafuji, Y. Yamaguchi, D. Tomono, and F. Minato, "In-Beam Activation Measurement of Muon Nuclear Capture Reaction on Si Isotopes," The workshop on frontier nuclear studies with gamma-ray spectrometer arrays (gamma24), March 2024.

[5] R. Mizuno, M. Niikura, T. Y. Saito, T. Matsuzaki, S. Abe, H. Fukuda, M. Hashimoto, K. Ishida, N. Kawamura, S. Kawase, M. Oishi, P. Strasser, A. Sato, K. Shimomura, S. Takeshita, I. Umegaki, A. Hillier, T. Kawata, K. Kitafuji, Y. Yamaguchi, D. Tomono, and F. Minato, "Muon Nuclear Capture Reaction on 28,29,30si," 2023 Fall meeting of APS DNP and JPS, November 2023.

[6] Y. Gomi, K. Takami, R. Mizuno, M. Niikura, Y. Deng, S. Kawase, Y. Watanabe, S. Abe, W. Liao, M. Tampo, I. Umegaki, S. Takeshita, K. Shimomura, Y. Miyake, and M. Hashimoto, "Muon-Induced SEU Cross Sections of 12-nm FinFET and 28-nm Planar SRAMs," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), September 2023. [pdf]

[7] M. Niikura, R. Mizuno, S. Manabe, T. Y. Saito, T. Matsuzaki, S. Abe, H. Fukuda, M. Hashimoto, K. Ishida, A. Hillier, N. Kawamura, Y. Kawashima, S. Kawase, T. Kawata, K. Kitafuji, F. Minato, M. Oishi, P. Strasser, A. Sato, K. Shimomura, S. Takeshita, M. Tampo, D. Tomono, I. Umegaki, Y. Yamaguchi, and Y. Watanabe, "Nuclear Physics for Muon-Induced Soft Error," Workshop for Computational Technique for Negative Muon Spectroscopy and Elemental Analysis, August 2023.

[8] R. Mizuno, M. Niikura, T. Y. Saito, S. Abe, H. Fukuda, M. Hashimoto, K. Ishida, N. Kawamura, S. Kawase, T. Matsuzaki, M. Oishi, P. Strasser, A. Sato, K. Shimomura, S. Takeshita, and I. Umegaki, "Study of Muon Capture Reaction on Si Via In-Beam Muon Activation," Advances in Radioactive Isotope Science (ARIS), June 2023.

[9] R. Mizuno, M. Niikura, T. Y. Saito, S. Abe, H. Fukuda, M. Hashimoto, K. Ishida, N. Kawamura, S. Kawase, T. Matsuzaki, M. Oishi, P. Strasser, A. Sato, K. Shimomura, S. Takeshita, and I. Umegaki, "Study of Muon Capture Reaction on Si Via In-Beam Muon Activation," Topical Workshops on Modern Aspects of Nuclear Structure, February 2023.

[10] R. Mizuno, M. Niikura, T. Y. Saito, S. Abe, H. Fukuda, M. Hashimoto, K. Ishida, N. Kawamura, S. Kawase, T. Matsuzaki, M. Oishi, P. Strasser, A. Sato, K. Shimomura, S. Takeshita, and I. Umegaki, "Measurement of Muon-Induced Nuclear Transmutation for Si Isotopes," Trans-scale Quantum Science Institute, November 2022.

[11] T. Mahara, S. Manabe, Y. Watanabe, W. Liao, M. Hashimoto, T. Y. Saito, M. Niikura, K. Ninomiya, D. Tomono, and A. Sato, "Irradiation Test of 65-nm Bulk SRAMs with DC Muon Beam at RCNP-MuSIC Facility," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), September 2019.

研究会・全国大会等

[1] R. Mizuno, M. Niikura, T. Y. Saito, T. Matsuzaki, S. Abe, H. Fukuda, M. Hashimoto, K. Ishida, N. Kawamura, S. Kawase, M. Oishi, P. Strasser, A. Sato, K. Shimomura, S. Takeshita, I. Umegaki, A. Hillier, T. Kawata, K. Kitafuji, and D. Tomono, "ミューオン原子核捕獲反応による生成核分岐比の測定," 第12回停止・低速RIビームを用いた核分光研究会 (12th SSRI), September 2023.