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この検索内の頻出タグ: multiple-cell:2 upsets:2 12-nm:1 22-nm:1 55-nm:1 analysis:1 event-wise:1 finfet:1 measurement:1 multi-cell:1 neutron-induced:1 parasitic-bipolar-effect-induced:1 quasi:1 simulation:1 sram:1 srams:1 tcad:1

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論文誌
[1] Yuibi Gomi, Kazusa Takami, Ryuichi Yasuda, Hiroki Kanda, Mitsuhiro Fukuda, and Masanori Hashimoto, "Quasi Event-Wise Measurement and Simulation of Neutron-Induced Multiple-Cell Upsets in 22-nm and 55-nm SRAMs," IEEE Transactions on Nuclear Science, 採録済.
国際会議
[1] Ryuichi Yasuda, Koichi Fukuda, Junichi Hattori, Kozo Takeuchi, Kozo Takeuchi, and Masanori Hashimoto, "Multi-Cell TCAD Analysis of Parasitic-Bipolar-Effect-Induced Multiple-Cell Upsets in a 12-nm FinFET SRAM," Proceedings of International Conference on Integrated Circuits, Design and Verification (ICDV), 採録済.