List of works
この検索内の頻出タグ: method:3 cross-section:2 design:2 direct:2 event:2 induced:2 ionization:2 prediction:2 proton:2 single:2 upset:2 ai:1 architecture:1 challenges:1 characteristics:1 characterization:1 cnn-based:1 construction:1 counter:1 countermeasures:1 cpu:1 degradation:1 device:1 error:1 exploration:1 linear:1 ml-assisted:1 model:1 noisy:1 opportunities:1
- 論文誌
- [1] K. Takeuchi, K. Sakamoto, Y. Tsuchiya, T. Kato, R. Nakamura, A. Takeyama, T. Makino, T. Ohshima, M. Hashimoto, and H. Shindo, "Cross-Section Prediction Method for Proton Direct Ionization Induced Single Event Upset," IEEE Transactions on Nuclear Science, 採録済.
- 国際会議
- [1] M. Hashimoto, R. Yasuda, K. Takami, Y. Gomi, and K. Takeuchi, "ML-assisted SRAM Soft Error Rate Characterization: Opportunities and Challenges," Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC), 379 - 384, January 2025. [pdf]
- [2] K. Takeuchi, K. Sakamoto, Y. Tsuchiya, T. Kato, R. Nakamura, A. Takeyama, T. Makino, T. Ohshima, M. Hashimoto, and H. Shindo, "Cross-Section Prediction Method for Proton Direct Ionization Induced Single Event Upset," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), September 2024.
- [3] T. Tanaka, M. Hashimoto, and Y. Takeuchi, "Linear Programming Based Reliable Software Performance Model Construction with Noisy CPU Performance Counter Values," Proceedings of Workshop on Synthesis and System Integration of Mixed Technologies (SASIMI), March 2021.
- [4] S. Sombatsiri, J. Yu, M. Hashimoto, and Y. Takeuchi, "A Design Space Exploration Method of SoC Architecture for CNN-based AI Platform," Proceedings of Workshop on Synthesis and System Integration of Mixed Technologies (SASIMI), October 2019.
- 著書
- [1] T. Sato, M. Hashimoto, S. Tanakamaru, K. Takeuchi, Y. Sato, S. Kajihara, M. Yoshimoto, J. Jung, Y. Kimi, H. Kawaguchi, H. Shimada, and J. Yao, "Time-Dependent Degradation in Device Characteristics and Countermeasures by Design," Book chapter, VLSI Design and Test for Systems Dependability, Springer, August 2018.