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論文誌

[1] K. Takeuchi, K. Sakamoto, Y. Tsuchiya, T. Kato, R. Nakamura, A. Takeyama, T. Makino, T. Ohshima, M. Hashimoto, and H. Shindo, "Cross-Section Prediction Method for Proton Direct Ionization Induced Single Event Upset," IEEE Transactions on Nuclear Science, volume 72, number 8, 2735 - 2742, August 2025. [pdf]

[2] S. Manabe, Y. Watanabe, W. Liao, M. Hashimoto, K. Nakano, H. Sato, T. Kin, S. Abe, K. Hamada, M. Tampo, and Y. Miyake, "Negative and Positive Muon-Induced Single Event Upsets in 65-nm UTBB SOI SRAMs," IEEE Transactions on Nuclear Science, volume 65, number 8, pages 1742--1749, August 2018. [pdf]

[3] W. Liao, M. Hashimoto, S. Manabe, Y. Watanabe, K. Nakano, H. Sato, T. Kin, K. Hamada, M. Tampo, and Y. Miyake, "Measurement and Mechanism Investigation of Negative and Positive Muon-Induced Upsets in 65-nm Bulk SRAMs," IEEE Transactions on Nuclear Science, volume 65, number 8, pages 1734--1741, August 2018. [pdf]

国際会議

[1] K. Takeuchi, K. Sakamoto, Y. Tsuchiya, T. Kato, R. Nakamura, A. Takeyama, T. Makino, T. Ohshima, M. Hashimoto, and H. Shindo, "Cross-Section Prediction Method for Proton Direct Ionization Induced Single Event Upset," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), September 2024.

[2] W. Liao, M. Hashimoto, S. Manabe, Y. Watanabe, K. Nakano, H. Sato, T. Kin, K. Hamada, M. Tampo, and Y. Miyake, "Measurement and Mechanism Investigation of Negative and Positive Muon Induced Upsets in 65nm Bulk SRAMs," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), October 2017.

[3] S. Manabe, Y. Watanabe, W. Liao, M. Hashimoto, K. Nakano, H. Sato, T. Kin, K. Hamada, M. Tampo, and Y. Miyake, "Momentum and Supply Voltage Dependencies of SEUs Induced by Low-Energy Negative and Positive Muons in 65-nm UTBB-SOI SRAMs," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), October 2017.