この検索内の頻出タグ: induced^:4 negative^:4 positive^:4 srams^:4 event^:3 single^:3 upsets^:3 65-nm^:2 65nm^:2 bulk^:2 cross-section^:2 direct^:2 investigation^:2 ionization^:2 measurement^:2 mechanism^:2 method^:2 muon-induced^:2 prediction^:2 proton^:2 upset^:2 dependencies^:1 low-energy^:1 momentum^:1 muon^:1 muons^:1 seus^:1 soi^:1 supply^:1 utbb^:1

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\title{\LARGE\bf 研究業績リスト}

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\fancyhead[CE,CO]{\bf 研究業績リスト}
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\section{論文誌}
\label{sec:0}

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\item
K. Takeuchi, K. Sakamoto, Y. Tsuchiya, T. Kato, R. Nakamura, A. Takeyama, T. Makino, T. Ohshima, M. Hashimoto, and H. Shindo, ``Cross-Section Prediction Method for Proton Direct Ionization Induced Single Event Upset,'' IEEE Transactions on Nuclear Science, volume 72, number 8, 2735 - 2742, August 2025.
\item
S. Manabe, Y. Watanabe, W. Liao, M. Hashimoto, K. Nakano, H. Sato, T. Kin, S. Abe, K. Hamada, M. Tampo, and Y. Miyake, ``Negative and Positive Muon-Induced Single Event Upsets in {65-nm} {UTBB} {SOI} {SRAMs},'' IEEE Transactions on Nuclear Science, volume 65, number 8, pages 1742--1749, August 2018.
\item
W. Liao, M. Hashimoto, S. Manabe, Y. Watanabe, K. Nakano, H. Sato, T. Kin, K. Hamada, M. Tampo, and Y. Miyake, ``Measurement and Mechanism Investigation of Negative and Positive Muon-Induced Upsets in {65-nm} Bulk {SRAMs},'' IEEE Transactions on Nuclear Science, volume 65, number 8, pages 1734--1741, August 2018.
\end{enumerate}
\section{国際会議}
\label{sec:1}

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\begin{enumerate}
\item
K. Takeuchi, K. Sakamoto, Y. Tsuchiya, T. Kato, R. Nakamura, A. Takeyama, T. Makino, T. Ohshima, M. Hashimoto, and H. Shindo, ``Cross-Section Prediction Method for Proton Direct Ionization Induced Single Event Upset,'' Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS),   September 2024.
\item
W. Liao, M. Hashimoto, S. Manabe, Y. Watanabe, K. Nakano, H. Sato, T. Kin, K. Hamada, M. Tampo, and Y. Miyake, ``Measurement and Mechanism Investigation of Negative and Positive Muon Induced Upsets in 65nm Bulk {SRAMs},'' Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS),   October 2017.
\item
S. Manabe, Y. Watanabe, W. Liao, M. Hashimoto, K. Nakano, H. Sato, T. Kin, K. Hamada, M. Tampo, and Y. Miyake, ``Momentum and Supply Voltage Dependencies of {SEUs} Induced by Low-Energy Negative and Positive Muons in {65-nm} {UTBB-SOI} {SRAMs},'' Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS),   October 2017.
\end{enumerate}
以上．
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