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T. Sato, J. Ichimiya, N. Ono, and M. Hashimoto, "On-Chip Thermal Gradient Analysis Considering Interdependence between Leakage Power and Temperature," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, E89-A(12), pp. 3491-3499, December 2006. | |
ID | 6 |
分類 | 論文誌 |
タグ | |
表題 (title) |
On-Chip Thermal Gradient Analysis Considering Interdependence between Leakage Power and Temperature |
表題 (英文) |
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著者名 (author) |
T. Sato,J. Ichimiya,N. Ono,M. Hashimoto |
英文著者名 (author) |
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キー (key) |
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定期刊行物名 (journal) |
IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences |
定期刊行物名 (英文) |
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巻数 (volume) |
E89-A |
号数 (number) |
12 |
ページ範囲 (pages) |
3491-3499 |
刊行月 (month) |
12 |
出版年 (year) |
2006 |
Impact Factor (JCR) |
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URL |
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付加情報 (note) |
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注釈 (annote) |
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内容梗概 (abstract) |
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論文電子ファイル | 4.pdf (application/pdf) [一般閲覧可] |
BiBTeXエントリ |
@article{id6, title = {On-chip thermal gradient analysis considering interdependence between leakage power and temperature}, author = {T. Sato and J. Ichimiya and N. Ono and M. Hashimoto}, journal = {IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences}, volume = {E89-A}, number = {12}, pages = {3491-3499}, month = {12}, year = {2006}, } |