この検索内の頻出タグ: srams^:3 12-^:2 coupled^:2 estimated^:2 irradiation^:2 neutron^:2 one-time^:2 ser^:2 simulation^:2 terrestrial^:2 validating^:2 22-nm^:1 28-^:1 28-nm^:1 55-nm^:1 65-nm^:1 event-wise^:1 measurement^:1 multiple-cell^:1 neutron-induced^:1 quasi^:1 upsets^:1

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論文誌

[1] K. Takami, Y. Gomi, R. Yasuda, S. Abe, M. Itoh, H. Kanda, M. Fukuda, and M. Hashimoto, "Validating Terrestrial SER in 12-, 28- and 65-nm SRAMs Estimated by Simulation Coupled with One-Time Neutron Irradiation," IEEE Transactions on Nuclear Science, 採録済.

国際会議

[1] Y. Gomi, K. Takami, R. Yasuda, H. Kanda, M. Fukuda, and M. Hashimoto, "Quasi Event-Wise Measurement of Neutron-Induced Multiple-Cell Upsets in 22-nm and 55-nm SRAMs," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), 採録済.

[2] K. Takami, Y. Gomi, R. Yasuda, S. Abe, M. Itoh, H. Kanda, M. Fukuda, and M. Hashimoto, "Validating Terrestrial SER in 12- and 28-nm SRAMs Estimated by Simulation Coupled with One-Time Neutron Irradiation," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), September 2024.