Search: 簡易 | 詳細 || Language: 英語 | 日本語 || ログイン |

この検索内の頻出タグ: 22-nm:2 55-nm:2 event-wise:2 measurement:2 quasi:2 srams:2 analysis:1 distant:1 dynamic:1 mcu:1 multiple-cell:1 neutron-induced:1 proton-induced:1 simulation:1 upsets:1

2 件の該当がありました． : このページのURL : HTML


論文誌
[1] Yuibi Gomi, Kazusa Takami, Ryuichi Yasuda, Hiroki Kanda, Mitsuhiro Fukuda, and Masanori Hashimoto, "Quasi Event-Wise Measurement and Simulation of Neutron-Induced Multiple-Cell Upsets in 22-nm and 55-nm SRAMs," IEEE Transactions on Nuclear Science, 採録済.
国際会議
[1] Yuibi Gomi, Kazusa Takami, Koyo Morita, and Masanori Hashimoto, "Proton-Induced Distant MCU Analysis with Quasi Event-Wise Dynamic Measurement in 22-nm and 55-nm SRAMs," Proceedings of International Reliability Physics Symposium (IRPS), March 2026.