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論文誌
[1] Yuhao Wang, Toshihisa Tanaka, Tomochika Harada, Masanori Hashimoto, and Ryo Shirai, "A Compact Triaxial Hall Sensor Compatible with Standard Cmos Process Leveraging Horizontal and Vertical Current Flow within Deep N-Well," IEEE Sensors Journal, 採録済.
国際会議
[1] Y. Masuda, J. Nagayama, T. Cheng, T. Ishihara, Y. Momiyama, and M. Hashimoto, "Critical Path Isolation and Bit-Width Scaling Are Highly Compatible for Voltage Over-Scalable Design," Proceedings of Design, Automation and Test in Europe Conference (DATE), February 2021. [pdf]