この検索内の頻出タグ: compatible^:2 are^:1 bit-width^:1 cmos^:1 compact^:1 critical^:1 current^:1 deep^:1 design^:1 flow^:1 hall^:1 highly^:1 horizontal^:1 isolation^:1 leveraging^:1 n-well^:1 over-scalable^:1 path^:1 process^:1 scaling^:1 sensor^:1 standard^:1 triaxial^:1 vertical^:1 voltage^:1

2 件の該当がありました． : このページのURL : HTML

論文誌

[1] Yuhao Wang, Toshihisa Tanaka, Tomochika Harada, Masanori Hashimoto, and Ryo Shirai, "A Compact Triaxial Hall Sensor Compatible with Standard Cmos Process Leveraging Horizontal and Vertical Current Flow within Deep N-Well," IEEE Sensors Journal, volume 26, number 6, pages 8142-8151, March 2026. [pdf]

国際会議

[1] Y. Masuda, J. Nagayama, T. Cheng, T. Ishihara, Y. Momiyama, and M. Hashimoto, "Critical Path Isolation and Bit-Width Scaling Are Highly Compatible for Voltage Over-Scalable Design," Proceedings of Design, Automation and Test in Europe Conference (DATE), February 2021. [pdf]