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論文誌

[1] Y. Gomi, A. Sato, W. Madany, K. Okada, S. Adachi, M. Itoh, and M.Hashimoto, "A 55-nm SRAM Chip Scanning Errors Every 125 ns for Event-Wise Soft Error Measurement," IEEE Solid-State Circuits Letters, volume 8, pages 245-248, September 2025. [pdf]

[2] Y. Li, M. Yoshida, Y. Gomi, Y. Deng, Y. Watanabe, S. Adachi, M. Itoh, G. Zhang, C. He, and M. Hashimoto, "Experimental Study of Proton-Induced Radiation Effects on DDR5 Modules," IEEE Transactions on Nuclear Science, volume 72, number 6, pages 1907-1918, June 2025. [pdf]