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論文誌

[1] Yuhao Wang, Toshihisa Tanaka, Tomochika Harada, Masanori Hashimoto, and Ryo Shirai, "A Compact Triaxial Hall Sensor Compatible with Standard Cmos Process Leveraging Horizontal and Vertical Current Flow within Deep N-Well," IEEE Sensors Journal, 採録済. [pdf]

[2] Quan Cheng, Qiufeng Li, Weirong Dong, Mingtao Zhang, Ruilin Zhang, Mingqiang Huang, Hao Yu, Yiyu Shi, Hiromitsu Awano, Takashi Sato, Mehdi Saligane, Longyang Lin, and Masanori Hashimoto, "Frieren: a Fault-Tolerant Reconfigurable Energy-Efficient Computing Architecture with Enhanced Reliability in Harsh Environments," IEEE Transactions on Computers, 採録済.

国際会議

[1] Weirong Dong, Kai Zhou, Zhen Kong, Zhenke Yang, Quan Cheng, Haoyuan Li, Junkai Huang, Masanori Hashimoto and Longyang Lin, "Drift-Aware Reliability Calibration for Rram In-Memory Computing Via Vector-Based Lightweight Approach," Proceedings of Design Automation Conference (DAC), 採録済.

[2] Quan Cheng, Haoyuan Li, Wang LIAO, Feng Liang, Longyang Lin, and Masanori Hashimoto, "Gohan: a Golden-Copy-Aided Platform Enabling Online Hybrid-Interactive Reliability Analysis," Proceedings of Design, Automation and Test in Europe Conference (DATE), April 2026. [pdf]

[3] Quan Cheng, Haoyuan Li, Zhenzhe Chen, Wang LIAO, Jing-jia Liou, Masanori Hashimoto, and Longyang Lin, "Ramen: Radiation-Aware Modeling Framework for Pdk-Enabled Design and Library Characterization," Proceedings of Design, Automation and Test in Europe Conference (DATE), April 2026. [pdf]

[4] Quan Cheng, Haoyuan Li, Weirong Dong, Mingqiang Huang, Longyang Lin, and Masanori Hashimoto, "Gundam: a Generalized Unified Design and Analysis Model for Matrix Multiplication on Edge," Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC), January 2026. [pdf]

[5] Quan Cheng, Hao-Yang Chi, Chien-Hsing Liang, Yu-Hong Chao, Huizi Zhang, Yuan Liang, Mingtao Zhang, Wang Liao, Jinjun Xiong, Jing-Jia Liou, Masanori Hashimoto, and Longyang Lin, "Genshin: a Generalized Framework with Software-Hardware Co-Design and Pruned Fault Injection for Reliability Analysis," Proceedings of International Test Conference (ITC), September 2025. [pdf]