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この検索内の頻出タグ: 22-nm:1 55-nm:1 event-wise:1 measurement:1 multiple-cell:1 neutron-induced:1 quasi:1 simulation:1 srams:1 upsets:1

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論文誌
[1] Yuibi Gomi, Kazusa Takami, Ryuichi Yasuda, Hiroki Kanda, Mitsuhiro Fukuda, and Masanori Hashimoto, "Quasi Event-Wise Measurement and Simulation of Neutron-Induced Multiple-Cell Upsets in 22-nm and 55-nm SRAMs," IEEE Transactions on Nuclear Science, volume 73, number 8, 2935 - 2947, August 2026. [pdf]