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この検索内の頻出タグ: 22-nm^:1 55-nm^:1 event-wise^:1 measurement^:1 multiple-cell^:1 neutron-induced^:1 quasi^:1 simulation^:1 srams^:1 upsets^:1

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論文誌: [1] Yuibi Gomi, Kazusa Takami, Ryuichi Yasuda, Hiroki Kanda, Mitsuhiro Fukuda, and Masanori Hashimoto, "Quasi Event-Wise Measurement and Simulation of Neutron-Induced Multiple-Cell Upsets in 22-nm and 55-nm SRAMs," IEEE Transactions on Nuclear Science, 採録済.