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この検索内の頻出タグ: 65-nm:1 angle:1 bulk:1 cross:1 impact:1 incident:1 muon-induced:1 negative:1 section:1 seu:1 sram:1

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国際会議
[1] W. Liao, M. Hashimoto, S. Manabe, Y. Watanabe, S. Abe, M. Tampo, S. Takeshita, and Y. Miyake, "Impact of Incident Angle on Negative Muon-Induced SEU Cross Section of 65-nm Bulk SRAM," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), September 2019.