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国際会議
[1] T. Tanaka, T. Uezono, K. Suenaga, and M. Hashimoto, "Hardware Error Detection with In-Situ Monitoring of Control Flow-Related Specifications," Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC), 採録済.
[2] Y. Masuda, J. Nagayama, H. Takeno, Y. Ogawa, Y. Momiyama, and M. Hashimoto, "Comparing Voltage Adaptation Performance between Replica and In-Situ Timing Monitors," Proceedings of ACM/IEEE International Conference on Computer-Aided Design (ICCAD), November 2018. [pdf]