Table of works
Frequent tags in this search: characteristics:1 countermeasures:1 degradation:1 design:1 device:1 time-dependent:1
1 publications are found. : URL for this page. : HTML
| Author (author) | Title (title) | Journal/Conference | Volume / Number | Pages (pages) | Published date | Impact factor / Acceptance | File | |
|---|---|---|---|---|---|---|---|---|
| Book |
T. Sato, M. Hashimoto, S. Tanakamaru, K. Takeuchi, Y. Sato, S. Kajihara, M. Yoshimoto, J. Jung, Y. Kimi, H. Kawaguchi, H. Shimada, J. Yao |
Time-Dependent Degradation in Device Characteristics and Countermeasures by Design |
Book chapter, VLSI Design and Test for Systems Dependability, Springer | August 2018 |