この検索内の頻出タグ: single^:14 event^:10 upsets^:6 impact^:5 upset^:5 65-nm^:4 induced^:4 srams^:4 bulk^:3 irradiation^:3 neutron-induced^:3 side^:3 coil^:2 cross-section^:2 direct^:2 ionization^:2 method^:2 muon-induced^:2 neutron^:2 prediction^:2 proton^:2 -secded^:1 20^:1 3d^:1 anchor^:1 bit^:1 burst^:1 capsule^:1 daily^:1 dc^:1

14 件の該当がありました． : このページのURL : HTML

@article{id659,
         title = {Cross-section Prediction Method for Proton Direct Ionization Induced Single Event Upset},
        author = {K. Takeuchi and K. Sakamoto and Y. Tsuchiya and T. Kato and R. Nakamura and A. Takeyama and T. Makino and T. Ohshima and M. Hashimoto and H. Shindo},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {72},
        number = {8},
         pages = {2735 - 2742},
         month = {8},
          year = {2025},
}

@article{id629,
         title = {Impact of Irradiation Side on Muon-Induced Single Event Upsets in {65-nm} Bulk {SRAMs}},
        author = {Y. Deng and Y. Watanabe and S. Manabe and W. Liao and M. Hashimoto and S. Abe and M. Tampo and Y. Miyake},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {71},
        number = {4},
         pages = {912-920},
         month = {4},
          year = {2024},
}

@article{id532,
         title = {{DC} Magnetic Field Based {3D} Localization with Single Anchor Coil},
        author = {R. Shirai and M. Hashimoto},
       journal = {IEEE Sensors Journal},
        volume = {20},
        number = {7},
         pages = {3902 -- 3913},
         month = {4},
          year = {2020},
}

@article{id506,
         title = {Impact of Irradiation Side on Neutron-induced Single Event Upsets in {65-nm} Bulk {SRAMs}},
        author = {S. Abe and W. Liao and S. Manabe and T. Sato and M. Hashimoto and Y.  Watanabe},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {66},
        number = {7},
         pages = {1374 -- 1380},
         month = {7},
          year = {2019},
}

@article{id476,
         title = {Negative and Positive Muon-Induced Single Event Upsets in {65-nm} {UTBB} {SOI} {SRAMs}},
        author = {S. Manabe and Y. Watanabe and W. Liao and M. Hashimoto and K. Nakano and H. Sato and T. Kin and S. Abe and K. Hamada and M. Tampo and Y. Miyake},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {65},
        number = {8},
         pages = {1742--1749},
         month = {8},
          year = {2018},
}

@article{id638,
         title = {Cross-section Prediction Method for Proton Direct Ionization Induced Single Event Upset},
        author = {K. Takeuchi and K. Sakamoto and Y. Tsuchiya and T. Kato and R. Nakamura and A. Takeyama and T. Makino and T. Ohshima and M. Hashimoto and H. Shindo},
       journal = {Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)},
         month = {9},
          year = {2024},
}

@article{id599,
         title = {Single Bit Upsets versus Burst Errors of Stacked-Capacitor {DRAMs} Induced by High-Energy Neutron -{SECDED} is No Longer Effective-},
        author = {M. Kamibayashi and K. Kobayashi and M. Hashimoto},
       journal = {Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)},
         month = {10},
          year = {2022},
}

@article{id553,
         title = {Position and Posture Estimation of Capsule Endoscopy with a Single Wearable Coil Toward Daily Life Diagnosis},
        author = {R. Shimizu and R. Shirai and M. Hashimoto},
       journal = {Proceedings of International Midwest Symposium on Circuits and Systems (MWSCAS)},
         pages = {57--60},
         month = {8},
          year = {2020},
}

@article{id538,
         title = {Impact of Hydrided and Non-Hydrided Materials Near Transistors on Neutron-Induced Single Event Upsets},
        author = {S. Abe and T. Sato and J. Kuroda and S. Manabe and Y. Watanabe and W. Liao and K. Ito and M. Hashimoto and M. Harada and K. Oikawa and Y. Miyake},
       journal = {Proceedings of International Symposium on Reliability Physics (IRPS)},
         month = {4},
          year = {2020},
}

@article{id527,
         title = {When Single Event Upset Meets Deep Neural Networks: Observations, Explorations, and Remedies},
        author = {Z. Yan and Y. Shi and W. Liao and M. Hashimoto and X. Zhou and C. Zhuo},
       journal = {Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC)},
         month = {1},
          year = {2020},
}

@article{id484,
         title = {Impact of Irradiation Side on Neutron-induced Single Event Upsets in {65-nm} Bulk {SRAMs}},
        author = {S. Abe and W. Liao and S. Manabe and T. Sato and M. Hashimoto and Y. Watanabe},
       journal = {Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)},
         month = {9},
          year = {2018},
}

@article{id400,
         title = {Impact of Package on Neutron Induced Single Event Upset in 20 {nm} {SRAM}},
        author = {T. Uemura and T. Kato and S. Okano and H. Matsuyama and M. Hashimoto},
       journal = {Proceedings of International Symposium on Reliability Physics (IRPS)},
         month = {4},
          year = {2015},
}

@article{id401,
         title = {Investigation of Single Event Upset and Total Ionizing Dose in {FeRAM} for Medical Electronic Tag},
        author = {T. Uemura and M. Hashimoto},
       journal = {Proceedings of International Symposium on Reliability Physics (IRPS)},
         month = {4},
          year = {2015},
}

@inproceedings{id37,
         title = {Interconnect {RL} Extraction at a Single Representative Frequency},
        author = {A. Tsuchiya and M. Hashimoto and H. Onodera},
     booktitle = {Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC)},
         pages = {515-520},
         month = {1},
          year = {2006},
}