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この検索内の頻出タグ: analysis:1 circuits:1 functional:1 hold:1 room:1 stochastic:1 temperature:1 test:1 timing:1 ultra-low:1 violation:1

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論文誌
[1] T. Nakayama and M. Hashimoto, "Stochastic Analysis on Hold Timing Violation in Ultra-Low Temperature Circuits for Functional Test at Room Temperature," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume 102-A, number 7, pages 914--917, July 2019. [pdf]