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この検索内の頻出タグ: :1 board:1 circuits:1 cryptographic:1 em:1 evaluation:1 information:1 large:1 leakage:1 sasimi:1 scale:1

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国際会議
[1] D. Fujimoto, Y. Kim, Y. Hayashi, N. Homma, M. Hashimoto, T. Sato, and J.-L. Danger, "SASIMI: Evaluation Board for EM Information Leakage from Large Scale Cryptographic Circuits," IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity, August 2022. [pdf]