この検索内の頻出タグ: measurement^:10 neutron-induced^:6 set^:6 upsets^:6 bulk^:5 modulation^:5 pulse-width^:5 srams^:5 65-nm^:4 multiple^:4 rate^:4 sram^:4 10t^:3 cell^:3 impact^:3 mcu^:3 seu^:3 soft^:3 sotb^:3 subthreshold^:3 acquiring^:2 alpha-^:2 analysis^:2 angular^:2 characterization^:2 characterizing^:2 circuits^:2 dependency^:2 distribution^:2 effects^:2

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@article{id543,
         title = {Measurement of Single-Event Upsets in {65-nm} {SRAMs} Under Irradiation of Spallation Neutrons at {J-PARC} {MLF}},
        author = {J. Kuroda and S. Manabe and Y. Watanabe and K. Ito and W. Liao and M. Hashimoto and S. Abe and M. Harada and K. Oikawa and Y. Miyake},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {67},
        number = {7},
         pages = {1599 -- 1605},
         month = {7},
          year = {2020},
}

@article{id404,
         title = {Characterizing alpha- and neutron-induced {SEU} and {MCU} on {SOTB} and bulk {0.4-V} {SRAMs}},
        author = {S. Hirokawa and R. Harada and M. Hashimoto and T. Onoye},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {62},
        number = {2},
         pages = {420--427},
         month = {4},
          year = {2015},
}

@article{id376,
         title = {{SET} Pulse-Width Measurement Suppressing Pulse-Width Modulation and Within-die Process Variation Effects},
        author = {R. Harada and Y. Mitsuyama and M. Hashimoto and T. Onoye},
       journal = {IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences},
        volume = {E97-A},
        number = {7},
         pages = {1461--1467},
         month = {7},
          year = {2014},
}

@article{id345,
         title = {Measurement and Analysis of {Alpha-Particle-Induced} Soft Errors and Multiple Cell Upsets in {10T} Subthreshold {SRAM}},
        author = {H. Fuketa and R. Harada and M. Hashimoto and T. Onoye},
       journal = {IEEE Transactions on Device and Materials Reliability},
        volume = {14},
        number = {1},
         pages = {463 -- 470},
         month = {3},
          year = {2014},
}

@article{id336,
         title = {Impact of {NBTI-Induced} Pulse-Width Modulation on {SET} Pulse-Width Measurement},
        author = {R. Harada and Y. Mitsuyama and M. Hashimoto and T. Onoye},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {60},
        number = {4},
         pages = {2630--2634},
         month = {8},
          year = {2013},
}

@article{id332,
         title = {Angular Dependency of Neutron Induced Multiple Cell Upsets in {65-nm} {10T} Subthreshold {SRAM}},
        author = {R. Harada and S. Abe and H. Fuketa and T. Uemura and M. Hashimoto and Y. Watanabe},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {59},
        number = {6},
         pages = {2791--2795},
         month = {12},
          year = {2012},
}

@article{id275,
         title = {Measurement Circuits for Acquiring {SET} Pulse Width  Distribution with {Sub-FO1-inverter-delay} Resolution},
        author = {R. Harada and Y. Mitsuyama and M. Hashimoto and T. Onoye},
       journal = {IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences},
        volume = {E93-A},
        number = {12},
         pages = {2417--2423},
         month = {12},
          year = {2010},
}

@article{id538,
         title = {Impact of Hydrided and Non-Hydrided Materials Near Transistors on Neutron-Induced Single Event Upsets},
        author = {S. Abe and T. Sato and J. Kuroda and S. Manabe and Y. Watanabe and W. Liao and K. Ito and M. Hashimoto and M. Harada and K. Oikawa and Y. Miyake},
       journal = {Proceedings of International Symposium on Reliability Physics (IRPS)},
         month = {4},
          year = {2020},
}

@article{id519,
         title = {Characterizing Neutron-Induced {SDC} Rate of Matrix Multiplication in Tesla P4 {GPU}},
        author = {K. Ito and W. Liao and M. Hashimoto and J. Kuroda and S. Manabe and Y. Watanabe and S. Abe and M. Harada and K. Oikawa and Y. Miyake},
       journal = {Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)},
         month = {9},
          year = {2019},
}

@article{id521,
         title = {Measurement of Single-Event Upsets in {65-nm} Bulk {SRAMs} Under Irradiation of Spallation Neutrons at {J-PARC} {MLF}},
        author = {J. Kuroda and S. Manabe and Y. Watanabe and K. Ito and W. Liao and M. Hashimoto and S. Abe and M. Harada and K. Oikawa and Y. Miyake},
       journal = {Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)},
         month = {9},
          year = {2019},
}

@article{id452,
         title = {Contributions of {SRAM}, {FF} and Combinational Circuit to Chip-Level Neutron-Induced Soft Error Rate  -- Bulk {vs.} {FD-SOI} at 0.5 and {1.0V} --},
        author = {W. Liao and S. Hirokawa and R. Harada and M. Hashimoto},
       journal = {Proceedings of International NEWCAS Conference},
         pages = {33-37},
         month = {6},
          year = {2017},
}

@article{id435,
         title = {Multiple Sensitive Volume Based Soft Error Rate Estimation with Machine Learning},
        author = {S. Hirokawa and R. Harada and K. Sakuta and Y. Watanabe and M. Hashimoto},
       journal = {Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)},
         month = {9},
          year = {2016},
}

@article{id413,
         title = {Neutron-Induced {SEU} and {MCU} Rate Characterization and Analysis of {SOTB} and Bulk {SRAMs} at {0.3V} Operation},
        author = {S. Hirokawa and R. Harada and M. Hashimoto and K. Sakuta and Y. Watanabe},
       journal = {IEEE Nuclear and Space Radiation Effects Conference (NSREC)},
         month = {7},
          year = {2015},
}

@article{id379,
         title = {Measurement of Alpha- and Neutron-Induced {SEU} and {MCU} on {SOTB} and Bulk 0.4 V {SRAMs}},
        author = {R. Harada and S. Hirokawa and M. Hashimoto},
       journal = {IEEE Nuclear and Space Radiation Effects Conference (NSREC)},
         month = {7},
          year = {2014},
}

@article{id367,
         title = {{NBTI} Characterization Using Pulse-Width Modulation},
        author = {R. Harada and M. Hashimoto and T. Onoye},
       journal = {IEEE/ACM Workshop on Variability Modeling and Characterization},
         month = {11},
          year = {2013},
}

@article{id319,
         title = {Impact of {NBTI-Induced} Pulse-Width Modulation on {SET} Pulse-Width Measurement},
        author = {R. Harada and Y. Mitsuyama and M. Hashimoto and T. Onoye},
       journal = {Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)},
         month = {9},
          year = {2012},
}

@article{id316,
         title = {Angular Dependency of Neutron Induced Multiple Cell Upsets in {65-nm} {10T} Subthreshold {SRAM}},
        author = {R. Harada and S. Abe and H. Fuketa and T. Uemura and M. Hashimoto and Y. Watanabe},
       journal = {IEEE Nuclear and Space Radiation Effects Conference (NSREC)},
         month = {7},
          year = {2012},
}

@article{id315,
         title = {{SET} Pulse-Width Measurement Eliminating Pulse-Width Modulation and Within-die Process Variation Effects},
        author = {R. Harada and Y. Mitsuyama and M. Hashimoto and T. Onoye},
       journal = {Proceedings of International Reliability Physics Symposium (IRPS)},
         month = {4},
          year = {2012},
}

@article{id291,
         title = {Neutron Induced Single Event Multiple Transients With Voltage Scaling and Body Biasing},
        author = {R. Harada and Y. Mitsuyama and M. Hashimoto and T. Onoye},
       journal = {Proceedings of International Reliability Physics Symposium (IRPS)},
         pages = {253--257},
         month = {4},
          year = {2011},
}

@article{id259,
         title = {Measurement Circuits for Acquiring {SET} Pulse Width Distribution with {Sub-FO1-inverter-delay} Resolution},
        author = {R. Harada and Y. Mitsuyama and M. Hashimoto and T. Onoye},
       journal = {Proceedings of International Symposium on Quality Electronic Design (ISQED)},
         pages = {839--844},
         month = {3},
          year = {2010},
}