: T. Matsunaga, K. Sugai, M. Yano, and M. Hashimoto, Analysis of Tid-Induced Error Mechanisms in 58-Nm Nor Flash Memory, 採録済.
Detail of a work
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| T. Matsunaga, K. Sugai, M. Yano, and M. Hashimoto, "Analysis of Tid-Induced Error Mechanisms in 58-Nm Nor Flash Memory," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), 採録済. | |
| ID | 699 |
| 分類 | 国際会議 |
| タグ | 58-nm analysis error flash mechanisms memory nor tid-induced |
| 表題 (title) |
Analysis of Tid-Induced Error Mechanisms in 58-Nm Nor Flash Memory |
| 表題 (英文) |
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| 著者名 (author) |
Tadashi Matsunaga, Kensaku Sugai, Masaru Yano, Masanori Hashimoto |
| 英文著者名 (author) |
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| 定期刊行物名 (journal) |
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS) |
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| ページ範囲 (pages) |
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| 刊行月 (month) |
0 |
| 出版年 (year) |
(to appear) |
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| 内容梗概 (abstract) |
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| 論文電子ファイル | 利用できません． |
| BiBTeXエントリ |
@article{id699,
title = {Analysis of TID-Induced Error Mechanisms in 58-nm NOR Flash Memory},
author = {Tadashi Matsunaga and Kensaku Sugai and Masaru Yano and Masanori Hashimoto},
journal = {Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)},
month = {0},
year = {(to appear)},
}
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