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BibTeX list of works

23 件の該当がありました． : このページのURL : HTML

@article{id629,
         title = {Impact of Irradiation Side on Muon-Induced Single Event Upsets in {65-nm} Bulk {SRAMs}},
        author = {Y. Deng and Y. Watanabe and S. Manabe and W. Liao and M. Hashimoto and S. Abe and M. Tampo and Y. Miyake},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {71},
        number = {4},
         pages = {912-920},
         month = {4},
          year = {2024},
}

@article{id535,
         title = {Irradiation Test of 65 {nm} Bulk {SRAMs} with {DC} Muon Beam at {RCNP} {MuSIC} Facility},
        author = {T. Mahara and S. Manabe and Y. Watanabe and W. Liao and M. Hashimoto and T. Y. Saito and M. Niikura and K. Ninomiya and D. Tomono and A. Sato},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {67},
        number = {7},
         pages = {1555 -- 1559},
         month = {7},
          year = {2020},
}

@article{id540,
         title = {Impact of the Angle of Incidence on Negative Muon-induced {SEU} Cross Sections of {65-nm} Bulk and {FDSOI} {SRAMs}},
        author = {W. Liao and M. Hashimoto and S. Manabe and Y. Watanabe and S. Abe and M. Tampo and S. Takeshita and Y. Miyake},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {67},
        number = {7},
         pages = {1566 -- 1572},
         month = {7},
          year = {2020},
}

@article{id543,
         title = {Measurement of Single-Event Upsets in {65-nm} {SRAMs} Under Irradiation of Spallation Neutrons at {J-PARC} {MLF}},
        author = {J. Kuroda and S. Manabe and Y. Watanabe and K. Ito and W. Liao and M. Hashimoto and S. Abe and M. Harada and K. Oikawa and Y. Miyake},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {67},
        number = {7},
         pages = {1599 -- 1605},
         month = {7},
          year = {2020},
}

@article{id506,
         title = {Impact of Irradiation Side on Neutron-induced Single Event Upsets in {65-nm} Bulk {SRAMs}},
        author = {S. Abe and W. Liao and S. Manabe and T. Sato and M. Hashimoto and Y.  Watanabe},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {66},
        number = {7},
         pages = {1374 -- 1380},
         month = {7},
          year = {2019},
}

@article{id509,
         title = {Similarity analysis on neutron- and negative moun-induced {MCUs} in {65-nm} bulk {SRAM}},
        author = {W. Liao and M. Hashimoto and S. Manabe and S. Abe and Y. Watanabe},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {66},
        number = {7},
         pages = {1390 -- 1397},
         month = {7},
          year = {2019},
}

@article{id511,
         title = {Estimation of Muon-Induced {SEU} Rates for {65-nm} Bulk and {UTBB-SOI} {SRAMs}},
        author = {S. Manabe and Y. Watanabe and W. Liao and M. Hashimoto and S. Abe},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {66},
        number = {7},
         pages = {1398 -- 1403},
         month = {7},
          year = {2019},
}

@article{id476,
         title = {Negative and Positive Muon-Induced Single Event Upsets in {65-nm} {UTBB} {SOI} {SRAMs}},
        author = {S. Manabe and Y. Watanabe and W. Liao and M. Hashimoto and K. Nakano and H. Sato and T. Kin and S. Abe and K. Hamada and M. Tampo and Y. Miyake},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {65},
        number = {8},
         pages = {1742--1749},
         month = {8},
          year = {2018},
}

@article{id477,
         title = {Measurement and Mechanism Investigation of Negative and Positive Muon-Induced Upsets in {65-nm} Bulk {SRAMs}},
        author = {W. Liao and M. Hashimoto and S. Manabe and Y. Watanabe and K. Nakano and H. Sato and T. Kin and K. Hamada and M. Tampo and Y. Miyake},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {65},
        number = {8},
         pages = {1734--1741},
         month = {8},
          year = {2018},
}

@article{id632,
         title = {Nuclear physics for muon-induced soft error},
        author = {M. Niikura and   R. Mizuno and  S. Manabe and  T. Y. Saito and  T. Matsuzaki and  S. Abe and  H. Fukuda and  M. Hashimoto and  K. Ishida and  A. Hillier and  N. Kawamura and  Y. Kawashima and  S. Kawase and  T. Kawata and  K. Kitafuji and  F. Minato and  M. Oishi and  P. Strasser and  A. Sato and  K. Shimomura and  S. Takeshita and  M. Tampo and  D. Tomono and  I. Umegaki and  Y. Yamaguchi and  Y. Watanabe},
       journal = {Workshop for Computational Technique for Negative Muon Spectroscopy and Elemental Analysis},
         month = {8},
          year = {2023},
}

@article{id606,
         title = {Characterizing {SEU} Cross Sections of 12- and {28-nm} {SRAMs} for 6.0, 8.0, and 14.8 {MeV} Neutrons},
        author = {K. Takami and Y. Gomi and S. Abe and W. Liao and S. Manabe and T. Matsumoto and M. Hashimoto},
       journal = {Proceedings of International Reliability Physics Symposium (IRPS)},
         month = {3},
          year = {2023},
}

@article{id538,
         title = {Impact of Hydrided and Non-Hydrided Materials Near Transistors on Neutron-Induced Single Event Upsets},
        author = {S. Abe and T. Sato and J. Kuroda and S. Manabe and Y. Watanabe and W. Liao and K. Ito and M. Hashimoto and M. Harada and K. Oikawa and Y. Miyake},
       journal = {Proceedings of International Symposium on Reliability Physics (IRPS)},
         month = {4},
          year = {2020},
}

@article{id518,
         title = {Irradiation Test of {65-nm} Bulk {SRAMs} with {DC} Muon Beam at {RCNP-MuSIC} Facility},
        author = {T. Mahara and S. Manabe and Y. Watanabe and W. Liao and M. Hashimoto and T. Y. Saito and M. Niikura and K. Ninomiya and D. Tomono and A. Sato},
       journal = {Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)},
         month = {9},
          year = {2019},
}

@article{id519,
         title = {Characterizing Neutron-Induced {SDC} Rate of Matrix Multiplication in Tesla P4 {GPU}},
        author = {K. Ito and W. Liao and M. Hashimoto and J. Kuroda and S. Manabe and Y. Watanabe and S. Abe and M. Harada and K. Oikawa and Y. Miyake},
       journal = {Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)},
         month = {9},
          year = {2019},
}

@article{id520,
         title = {Impact of Incident Angle on Negative Muon-induced {SEU} Cross Section of {65-nm} Bulk {SRAM}},
        author = {W. Liao and M. Hashimoto and S. Manabe and Y. Watanabe and S. Abe and M. Tampo and S. Takeshita and Y. Miyake},
       journal = {Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)},
         month = {9},
          year = {2019},
}

@article{id521,
         title = {Measurement of Single-Event Upsets in {65-nm} Bulk {SRAMs} Under Irradiation of Spallation Neutrons at {J-PARC} {MLF}},
        author = {J. Kuroda and S. Manabe and Y. Watanabe and K. Ito and W. Liao and M. Hashimoto and S. Abe and M. Harada and K. Oikawa and Y. Miyake},
       journal = {Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)},
         month = {9},
          year = {2019},
}

@article{id500,
         title = {Negative and Positive Muon-induced {SEU} Cross Sections in {28-nm} and {65-nm} Planar Bulk {CMOS} {SRAMs}},
        author = {W. Liao and M. Hashimoto and S. Manabe and Y. Watanabe and S. Abe and M. Tampo and S. Takeshita and Y. Miyake},
       journal = {Proceedings of International Reliability Physics Symposium (IRPS)},
         month = {4},
          year = {2019},
}

@article{id496,
         title = {Characterizing soft error rates of {65-nm} {SOTB} and bulk {SRAMs} with muon and neutron beams (Invited)},
        author = {M. Hashimoto and W. Liao and S. Manabe and Y. Watanabe},
       journal = {Proceedings of SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)},
         month = {10},
          year = {2018},
}

@article{id482,
         title = {Estimation of Muon-Induced {SEU} Rates for {65-nm} Bulk and {UTBB-SOI} {SRAMs}},
        author = {S. Manabe and Y. Watanabe and W. Liao and M. Hashimoto and S. Abe},
       journal = {Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)},
         month = {9},
          year = {2018},
}

@article{id483,
         title = {Similarity analysis on neutron- and negative moun-induced {MCUs} in {65-nm} bulk {SRAM}},
        author = {W. Liao and M. Hashimoto and S. Manabe and S. Abe and Y. Watanabe},
       journal = {Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)},
         month = {9},
          year = {2018},
}

@article{id484,
         title = {Impact of Irradiation Side on Neutron-induced Single Event Upsets in {65-nm} Bulk {SRAMs}},
        author = {S. Abe and W. Liao and S. Manabe and T. Sato and M. Hashimoto and Y. Watanabe},
       journal = {Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)},
         month = {9},
          year = {2018},
}

@article{id453,
         title = {Measurement and Mechanism Investigation of Negative and Positive Muon Induced Upsets in 65nm Bulk {SRAMs}},
        author = {W. Liao and M. Hashimoto and S. Manabe and Y. Watanabe and K. Nakano and H. Sato and T. Kin and K. Hamada and M. Tampo and Y. Miyake},
       journal = {Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)},
         month = {10},
          year = {2017},
}

@article{id454,
         title = {Momentum and Supply Voltage Dependencies of {SEUs} Induced by Low-energy Negative and Positive Muons in {65-nm} {UTBB-SOI} {SRAMs}},
        author = {S. Manabe and Y. Watanabe and W. Liao and M. Hashimoto and K. Nakano and H. Sato and T. Kin and K. Hamada and M. Tampo and Y. Miyake},
       journal = {Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)},
         month = {10},
          year = {2017},
}