論文誌
[1] R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "SET Pulse-Width Measurement Suppressing Pulse-Width Modulation and Within-Die Process Variation Effects," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E97-A, number 7, pages 1461--1467, July 2014.
国際会議
[1] R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "SET Pulse-Width Measurement Eliminating Pulse-Width Modulation and Within-Die Process Variation Effects," Proceedings of International Reliability Physics Symposium (IRPS), April 2012.