論文誌
[1] T. Kanamoto, T. Okumura, K. Furukawa, H. Takafuji, A. Kurokawa, K. Hachiya, T. Sakata, M. Tanaka, H. Nakashima, H. Masuda, T. Sato, and M. Hashimoto, "Impact of Self-Heating in Wire Interconnection on Timing," IEICE Trans. on Electronics, volume E93-C, number 3, pages 388--392, March 2010.
[2] T. Sakata, T. Okumura, A. Kurokawa, H. Nakashima, H. Masuda, T. Sato, M. Hashimoto, K. Hachiya, K. Furukawa, M. Tanaka, H. Takafuji, and T. Kanamoto, "An Approach for Reducing Leakage Current Variation Due to Manufacturing Variability," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E92-A, number 12, pages 3016--3023, December 2009.
[3] T. Okumura, A. Kurokawa, H. Masuda, T. Kanamoto, M. Hashimoto, H. Takafuji, H. Nakashima, N. Ono, T. Sakata, and T. Sato, "Improvement in Computational Accuracy of Output Transition Time Variation Considering Threshold Voltage Variations," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume 92-A, number 4, pages 990--997, April 2009.
[4] A. Kurokawa, M. Hashimoto, A. Kasebe, Z.-C. Huang, Y. Yang, Y. Inoue, R. Inagaki, and H. Masuda, "Second-Order Polynomial Expressions for On-Chip Interconnect Capacitance," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E88-A, number 12, pages 3453-3462, December 2005.
国際会議
[1] Y. Masuda, J. Nagayama, H. Takeno, Y. Ogawa, Y. Momiyama, and M. Hashimoto, "Comparing Voltage Adaptation Performance between Replica and In-Situ Timing Monitors," Proceedings of ACM/IEEE International Conference on Computer-Aided Design (ICCAD), November 2018.