論文誌
[1] H. Konoura, T. Kameda, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "NBTI Mitigation Method by Inputting Random Scan-In Vectors in Standby Time," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E97-A, number 7, pages 1483--1491, July 2014.
[2] D. Alnajjar, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "PVT-induced Timing Error Detection Through Replica Circuits and Time Redundancy in Reconfigurable Devices," IEICE Electronics Express (ELEX), volume 10, number 5, April 2013.