国際会議
[1] M. Hashimoto and W. Liao, "Soft Error and Its Countermeasures in Terrestrial Environment," Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC), January 2020.
著書
[1] T. Sato, M. Hashimoto, S. Tanakamaru, K. Takeuchi, Y. Sato, S. Kajihara, M. Yoshimoto, J. Jung, Y. Kimi, H. Kawaguchi, H. Shimada, and J. Yao, "Time-Dependent Degradation in Device Characteristics and Countermeasures by Design," Book chapter, VLSI Design and Test for Systems Dependability, Springer, August 2018.