国際会議
[1] H. Konoura, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Comparative Study on Delay Degrading Estimation Due to NBTI with Circuit/Instance/Transistor-Level Stress Probability Consideration," Proceedings of International Symposium on Quality Electronic Design (ISQED), pages 646--651, March 2010.