国際会議
[1] D. Fujimoto, Y. Kim, Y. Hayashi, N. Homma, M. Hashimoto, T. Sato, and J.-L. Danger, "SASIMI: Evaluation Board for EM Information Leakage from Large Scale Cryptographic Circuits," IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity, August 2022.